Spectroscopic ellipsometry study of GaAs1−xBix material grown on GaAs substrate by atmospheric pressure metal-organic vapor-phase epitaxy
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2002 ◽
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2014 ◽
Vol 75
(2)
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pp. 244-251
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2010 ◽
Vol 268
(3-4)
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pp. 236-240
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1991 ◽
Vol 30
(Part 2, No. 5A)
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pp. L783-L785
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2004 ◽
Vol 43
(2)
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pp. 534-535
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