Disappearance of topographical contrast in the backscattered electron image in scanning electron microscopy

1983 ◽  
Vol 42 (6) ◽  
pp. 533-534 ◽  
Author(s):  
T. Ikuta
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Image ◽  
Backscattered Electron ◽  
Scanning Electron

Automated Inclusion Microanalysis in Steel by Computer-Based Scanning Electron Microscopy: Accelerating Voltage, Backscattered Electron Image Quality, and Analysis Time

2017 ◽  
Vol 23 (6) ◽  
pp. 1082-1090 ◽  
Author(s):  
Dai Tang ◽  
Mauro E. Ferreira ◽  
Petrus C. Pistorius
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Quantitative Information ◽  
X Rays ◽  
Electron Image ◽  
Backscattered Electron ◽  
Computer Based ◽  
Inclusion Distribution ◽  
Distribution Composition ◽  
Scanning Electron

AbstractAutomated inclusion microanalysis in steel samples by computer-based scanning electron microscopy provides rapid quantitative information on micro-inclusion distribution, composition, size distribution, morphology, and concentration. Performing the analysis at a lower accelerating voltage (10 kV), rather than the generally used 20 kV, improves analysis accuracy and may improve spatial resolution, but at the cost of a smaller backscattered electron signal and potentially smaller rate of generation of characteristic X-rays. These effects were quantified by simulation and practical measurements.

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