Strong orientation dependence of the formation of surface stacking faults during oxidation of float‐zone silicon
2005 ◽
Vol 488-489
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pp. 193-196
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1990 ◽
Vol 92
(1)
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pp. 801-802
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2011 ◽
Vol 702-703
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pp. 523-529
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1992 ◽
Vol 268
(1-3)
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pp. L287-L292
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2018 ◽
Vol 477
(2)
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pp. 2141-2153
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