High-resolution laboratory reflectometer for the study of x-ray optical elements in the soft and extreme ultraviolet wavelength ranges

2020 ◽  
Vol 91 (6) ◽  
pp. 063103
Author(s):  
S. A. Garakhin ◽  
N. I. Chkhalo ◽  
I. A. Kas’kov ◽  
A. Ya. Lopatin ◽  
I. V. Malyshev ◽  
...  
Keyword(s):  
High Resolution ◽  
Extreme Ultraviolet ◽  
Optical Elements ◽  
X Ray ◽  
Ultraviolet Wavelength

scholarly journals Extreme Ultraviolet Spectroscopy of Magnetic Cataclysmic Variables

1996 ◽  
Vol 152 ◽  
pp. 309-316
Author(s):  
Frits Paerels ◽  
Min Young Hur ◽  
Christopher W. Mauche
Keyword(s):  
High Resolution ◽  
White Dwarf ◽  
Extreme Ultraviolet ◽  
Cataclysmic Variables ◽  
Ultraviolet Spectroscopy ◽  
Temperature Structure ◽  
Polar Cap ◽  
Ultraviolet Emission ◽  
X Ray ◽  
Magnetic Cataclysmic Variables

A longstanding problem in the interpretation of the X-ray and extreme ultraviolet emission from strongly magnetic cataclysmic variables can be addressed definitively with high resolution EUV spectroscopy. A detailed photospheric spectrum of the accretion-heated polar cap of the white dwarf is sensitive in principle to the temperature structure of the atmosphere. This may allow us to determine where and how the bulk of the accretion energy is thermalized. The EUVE data on AM Herculis and EF Eridani are presented and discussed in this context.

Beryllium-Based Multilayer Mirrors for the Soft X-Ray and Extreme Ultraviolet Wavelength Ranges

2020 ◽  
Vol 14 (1) ◽  
pp. 124-134 ◽  
Author(s):  
Yu. A. Vainer ◽  
S. A. Garakhin ◽  
S. Yu. Zuev ◽  
A. N. Nechay ◽  
R. S. Pleshkov ◽  
...  
Keyword(s):  
Extreme Ultraviolet ◽  
Multilayer Mirrors ◽  
X Ray ◽  
Ultraviolet Wavelength

Alignment of the aberration-free XUV Raman spectrometer at FLASH

2019 ◽  
Vol 26 (1) ◽  
pp. 18-27 ◽  
Author(s):  
Mykola Biednov ◽  
Günter Brenner ◽  
Benjamin Dicke ◽  
Holger Weigelt ◽  
Barbara Keitel ◽  
...  
Keyword(s):  
Extreme Ultraviolet ◽  
Laser Interferometry ◽  
Grazing Incidence ◽  
Stray Light ◽  
Optical Scheme ◽  
Optical Elements ◽  
X Ray ◽  
Raman Spectrometer ◽  
Optical Alignment

An extreme-ultraviolet (XUV) double-stage Raman spectrometer is permanently installed as an experimental end-station at the PG1 beamline of the soft X-ray/XUV free-electron laser in Hamburg, FLASH. The monochromator stages are designed according to the Czerny–Turner optical scheme, adapted for the XUV photon energy range, with optical elements installed at grazing-incidence angles. Such an optical scheme along with the usage of off-axis parabolic mirrors for light collimation and focusing allows for aberration-free spectral imaging on the optical axis. Combining the two monochromators in additive dispersion mode allows for reaching high resolution and superior stray light rejection, but puts high demands on the quality of the optical alignment. In order to align the instrument with the highest precision and to quantitatively characterize the instrument performance and thus the quality of the alignment, optical laser interferometry, Hartmann–Shack wavefront-sensing measurements as well as off-line soft X-ray measurements and extensive optical simulations were conducted. In this paper the concept of the alignment scheme and the procedure of the internal optical alignment are presented. Furthermore, results on the imaging quality and resolution of the first monochromator stage are shown.

scholarly journals Ultraviolet Observations of Stellar Coronae: Early Results from HST

1992 ◽  
Vol 9 ◽  
pp. 657-658
Author(s):  
J.L. Linsky
Keyword(s):  
High Resolution ◽  
Spectral Resolution ◽  
Solar Flares ◽  
Extreme Ultraviolet ◽  
The Sun ◽  
X Ray ◽  
Spectroscopic Diagnostics ◽  
Early Results ◽  
Active Stars ◽  
Ultraviolet Observations

Although coronae for stars other than the Sun have previously been detected only in the X-ray and radio portions of the spectrum, the HST and future spacecraft sensitive to ultraviolet (UV) and extreme ultraviolet (ETIV) light will have the spectral resolution to study the dynamics and spectroscopic diagnostics of hot coronal plasmas. In the UV region accessible to HST, forbidden lines of FeXII at 1242 and 1349Å, of FeXXI at 1354Å, and other species seen in solar flares, are predicted to be present in the spectra of active stars. Upcoming observations with the Goddard High Resolution Spectrograph (GHRS) by S. Maran will search for these lines in the dM2e star AU Mic and other stars.

X-Ray Microbeam Studies of Electromigration

1999 ◽  
Vol 563 ◽  
Author(s):  
G. S. Cargill III ◽  
A. C. Ho ◽  
K. J. Hwang ◽  
H. K. Kao ◽  
P.-C. Wang ◽  
...  
Keyword(s):  
High Resolution ◽  
Real Time ◽  
High Stability ◽  
Polycrystalline Metal ◽  
Optical Elements ◽  
High Brightness ◽  
X Ray ◽  
Composition Changes ◽  
Stability Energy ◽  
Made In

AbstractThe interplay between stress and electromigration has been recognized since I. A. Blech et al. used x-ray topography in 1976 to demonstrate that stress gradients developed during electromigration. Availability of high brightness synchrotron x-ray sources, high stability energy dispersive detectors, high resolution area detectors, and pinholes, capillaries and other optical elements for forming x-ray microbeams, has made possible more quantitative, real time measurements of strains and composition changes which develop in polycrystalline metal conductor lines during electromigration. This paper describes advances made in this area, implications of results which have been obtained, and prospects for further progress.

Diffraction efficiency of 200-nm-period critical-angle transmission gratings in the soft x-ray and extreme ultraviolet wavelength bands

2011 ◽  
Vol 50 (10) ◽  
pp. 1364 ◽  
Author(s):  
Ralf K. Heilmann ◽  
Minseung Ahn ◽  
Alex Bruccoleri ◽  
Chih-Hao Chang ◽  
Eric M. Gullikson ◽  
...  
Keyword(s):  
Diffraction Efficiency ◽  
Critical Angle ◽  
Extreme Ultraviolet ◽  
X Ray ◽  
Ultraviolet Wavelength

scholarly journals Diffractive optical elements based on Fourier optical techniques: a new class of optics for extreme ultraviolet and soft x-ray wavelengths

2002 ◽  
Vol 41 (35) ◽  
pp. 7384 ◽  
Author(s):  
Chang Chang ◽  
Patrick Naulleau ◽  
Erik Anderson ◽  
Kristine Rosfjord ◽  
David Attwood
Keyword(s):  
Extreme Ultraviolet ◽  
Diffractive Optical Elements ◽  
Optical Elements ◽  
Optical Techniques ◽  
X Ray ◽  
New Class

An evaluation of multilayer mirrors for the soft x ray and extreme ultraviolet wavelength range that were irradiated with neutrons

1997 ◽  
Vol 68 (1) ◽  
pp. 757-760 ◽  
Author(s):  
S. P. Regan ◽  
M. J. May ◽  
V. Soukhanovskii ◽  
M. Finkenthal ◽  
H. W. Moos ◽  
...  
Keyword(s):  
Wavelength Range ◽  
Extreme Ultraviolet ◽  
Multilayer Mirrors ◽  
X Ray ◽  
Ultraviolet Wavelength

Combined Microstructure X-Ray Optics; Multilayer Diffraction Gratings

1987 ◽  
Vol 103 ◽  
Author(s):  
Troy W. Barbee
Keyword(s):  
High Efficiency ◽  
Extreme Ultraviolet ◽  
Diffraction Gratings ◽  
Experimental Results ◽  
Optical Elements ◽  
Ray Optics ◽  
X Ray ◽  
Spectral Ranges

ABSTRACTMultilayers are man-made microstructures engineered to vary in depth that are now of sufficient quality to be used as x-ray, soft x-ray and extreme ultraviolet optics. Gratings are in-plane man-made microstructures which have been used as optic elements for most of this century. Joining of these two optical elements to form combined microstructure optics has the potential for greatly enhancing both the resolution and the throughput attainable in these spectral ranges. Experimental results for multilayer gratings are presented and discussed. It will be demonstrated that multilayer diffraction gratings act as x-ray prisms and are high efficiency dispersion elements.

Flat-field grating spectrometer for high-resolution soft x-ray and extreme ultraviolet measurements on an electron beam ion trap

2004 ◽  
Vol 75 (10) ◽  
pp. 3723-3726 ◽  
Author(s):  
P. Beiersdorfer ◽  
E. W. Magee ◽  
E. Träbert ◽  
H. Chen ◽  
J. K. Lepson ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Ion Trap ◽  
Extreme Ultraviolet ◽  
X Ray ◽  
Grating Spectrometer ◽  
Electron Beam Ion Trap ◽  
Flat Field
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