X-Ray Microbeam Studies of Electromigration

1999 ◽  
Vol 563 ◽  
Author(s):  
G. S. Cargill III ◽  
A. C. Ho ◽  
K. J. Hwang ◽  
H. K. Kao ◽  
P.-C. Wang ◽  
...  

AbstractThe interplay between stress and electromigration has been recognized since I. A. Blech et al. used x-ray topography in 1976 to demonstrate that stress gradients developed during electromigration. Availability of high brightness synchrotron x-ray sources, high stability energy dispersive detectors, high resolution area detectors, and pinholes, capillaries and other optical elements for forming x-ray microbeams, has made possible more quantitative, real time measurements of strains and composition changes which develop in polycrystalline metal conductor lines during electromigration. This paper describes advances made in this area, implications of results which have been obtained, and prospects for further progress.

2012 ◽  
Vol 503-504 ◽  
pp. 1445-1449
Author(s):  
Li Min Chang ◽  
Xiang Bin Yu ◽  
Li Jing Zhang

In this paper, miniature air data system is designed based on thermally excited resonant silicon micro structural pressure sensor. The system employs thermally excited resonant silicon micro structural pressure sensor for the pressure measurement. Using miniature embedded computer, calculation of the parameters such as height, airspeed and mach number and real-time display by LCD are realized. The volume and weight of this system is only one-twelfth of the original. In addition, it has the characteristics of high accuracy, high resolution, high stability and repeatability.


1982 ◽  
Vol 46 (6) ◽  
pp. 1009-1013 ◽  
Author(s):  
Shih-Lin Chang ◽  
Hans-Joachim Queisser ◽  
Helmut Baumgart ◽  
Werner Hagen ◽  
Werner Hartmann

1995 ◽  
Vol 3 (5) ◽  
pp. 10-11
Author(s):  
Damon Heer

Part 1 of this article series (October 1994 issue) covered the performance features of various tip shapes and explained why the <100> crystal orientation is the industry standard. Part 2 (January/February 1995 issue) covered cathode mounting design and explained how the Mini Vogel Mount cathode design provides high-stability and long-lifetime performance.LaB6 and CeB6 cathodes are used as high-brightness, high-stability, longlifetime cathodes in a variety of electron beam applications. A high-brightness source provides small spot sizes for high resolution and improved analytical results from high beam currents.


2015 ◽  
Vol 1 (1) ◽  
pp. 286-289
Author(s):  
Philipp Jauer ◽  
Franziska Hainer ◽  
Floris Ernst

AbstractIn the recent past, 3D ultrasound has been gaining relevance in many biomedical applications. One main limitation, however, is that typical ultrasound volumes are either very poorly resolved or only cover small areas. We have developed a GPU-accelerated method for live fusion of freehand 3D ultrasound sweeps to create one large volume. The method has been implemented in CUDA and is capable of generating an output volume with 0.5 mm resolution in real time while processing more than 45 volumes per second, with more than 300.000 voxels per volume. First experiments indicate that large structures like a whole forearm or high-resolution volumes of smaller structures like the hand can be combined efficiently. It is anticipated that this technology will be helpful in pediatric surgery where X-ray or CT imaging is not always possible.


Author(s):  
Sumio Iijima ◽  
G. R. Anstis

Disorders in crystals with relatively simple structures which gave diffuse scattering have been extensively studied by X-ray or neutron diffraction methods. All these investigations were based on traditional diffraction methods and observations were made in reciprocal space (note observable diffraction intensities can be considered only in terms of interatomic vectors) and therefore the results obtained there leaves considerable ambiguity, particularly when we try to derive an actual model of the disordered crystals. A solution of this problem will be given only by knowing all atom positions in an assembly of atoms and for this case the observable diffracted intensity is given bywhere (xi,yi) and (xj,yj) represent position vectors of the i th and j th atoms with scattering factors fi and fj from an arbitrary origin. On the other hand, a crystal containing imperfections can be defined by


Sign in / Sign up

Export Citation Format

Share Document