Evolution from random lasing to erbium-related electroluminescence from metal-insulator-semiconductor structured light-emitting device with erbium-doped ZnO film on silicon

2020 ◽  
Vol 127 (5) ◽  
pp. 055705
Author(s):  
Jinxin Chen ◽  
Ziwei Wang ◽  
Jiahao Cao ◽  
Deren Yang ◽  
Xiangyang Ma
2020 ◽  
pp. 2000524
Author(s):  
Chen-Sheng Lin ◽  
Duncan W. E. Allsopp ◽  
Kate Cavanagh ◽  
Hei Chit Leo Tsui ◽  
Ling-Shan Yu ◽  
...  

2003 ◽  
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Pol Van Dorpe ◽  
Vasyl F. Motsnyi ◽  
Mayke Nijboer ◽  
Etienne Goovaerts ◽  
Viacheslav I. Safarov ◽  
...  

2008 ◽  
Vol 103 (1) ◽  
pp. 016103 ◽  
Author(s):  
T.-H. Cheng ◽  
M. H. Liao ◽  
Lingyen Yeh ◽  
T.-L. Lee ◽  
M.-S. Liang ◽  
...  

Plasmonics ◽  
2015 ◽  
Vol 10 (6) ◽  
pp. 1291-1300 ◽  
Author(s):  
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N. Bhadra ◽  
S. Das ◽  
S. Hussain ◽  
B. R. Chakraborty ◽  
...  

2019 ◽  
Vol 27 (21) ◽  
pp. 30919 ◽  
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Jinxin Chen ◽  
Weijun Zhu ◽  
Yuhan Gao ◽  
Deren Yang ◽  
Xiangyang Ma

2014 ◽  
Vol 2014 ◽  
pp. 1-4
Author(s):  
Lung-Chien Chen ◽  
Chih-Hung Hsu ◽  
Xiuyu Zhang ◽  
Jia-Ren Wu

ZnO:YAG-based metal-insulator-semiconductor (MIS) diodes with various insulators were synthesized on an indium tin oxide (ITO) glass by ultrasonic spray pyrolysis. SiO2and MnZnO (MZO) were separately used as insulators. X-ray diffraction revealed the crystalline structure of the ZnO:YAG film. The photoluminescence (PL) properties of the ZnO:YAG film were studied and the color of photoluminescence was found to be almost white. The electrical properties of the diodes with different insulators and thicknesses were compared. The diode with the SiO2insulator had a lower threshold voltage, smaller leakage current, and a higher series resistance than that with the MZO insulator layer.


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