Defect characterization of unannealed neutron transmutation doped silicon by means of deep temperature microwave detected photo induced current transient spectroscopy

2020 ◽  
Vol 127 (3) ◽  
pp. 035704 ◽  
Author(s):  
C. R. Engst ◽  
I. Eisele ◽  
C. Kutter
Keyword(s):  
Current Transient ◽  
Defect Characterization ◽  
Induced Current ◽  
Doped Silicon ◽  
Neutron Transmutation ◽  
Transient Spectroscopy ◽  
Deep Temperature

Contactless electrical defect characterization in semiconductors by microwave detected photo induced current transient spectroscopy (MD-PICTS) and microwave detected photoconductivity (MDP)

2011 ◽  
Vol 208 (4) ◽  
pp. 769-776 ◽  
Author(s):  
Bastian Berger ◽  
Nadine Schüler ◽  
Sabrina Anger ◽  
Bianca Gründig-Wendrock ◽  
Jürgen R. Niklas ◽  
...  
Keyword(s):  
Current Transient ◽  
Defect Characterization ◽  
Induced Current ◽  
Transient Spectroscopy

scholarly journals Photo-Induced Current Transient Spectroscopy of Semi-insulating Single Crystal Cs2Hg6S7

2014 ◽  
Vol 44 (1) ◽  
pp. 222-226 ◽  
Author(s):  
Z. Liu ◽  
J.A. Peters ◽  
H. Li ◽  
M. G. Kanatzidis ◽  
J. Im ◽  
...  
Keyword(s):  
Single Crystal ◽  
Current Transient ◽  
Induced Current ◽  
Transient Spectroscopy

Characterization of Defects in AlGaN/GaN HEMTs Based on Nonlinear Microwave Current Transient Spectroscopy

2017 ◽  
Vol 64 (5) ◽  
pp. 2135-2141 ◽  
Author(s):  
Agostino Benvegnu ◽  
Sylvain Laurent ◽  
Olivier Jardel ◽  
Jean-Luc Muraro ◽  
Matteo Meneghini ◽  
...  
Keyword(s):  
Current Transient ◽  
Gan Hemts ◽  
Transient Spectroscopy
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