Contactless electrical defect characterization in semiconductors by microwave detected photo induced current transient spectroscopy (MD-PICTS) and microwave detected photoconductivity (MDP)

Bastian Berger; Nadine Schüler; Sabrina Anger; Bianca Gründig-Wendrock; Jürgen R. Niklas; Kay Dornich

doi:10.1002/pssa.201083994

Contactless electrical defect characterization in semiconductors by microwave detected photo induced current transient spectroscopy (MD-PICTS) and microwave detected photoconductivity (MDP)

physica status solidi (a) ◽

10.1002/pssa.201083994 ◽

2011 ◽

Vol 208 (4) ◽

pp. 769-776 ◽

Cited By ~ 20

Author(s):

Bastian Berger ◽

Nadine Schüler ◽

Sabrina Anger ◽

Bianca Gründig-Wendrock ◽

Jürgen R. Niklas ◽

...

Keyword(s):

Current Transient ◽

Defect Characterization ◽

Induced Current ◽

Transient Spectroscopy

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Defect characterization of unannealed neutron transmutation doped silicon by means of deep temperature microwave detected photo induced current transient spectroscopy

Journal of Applied Physics ◽

10.1063/1.5134663 ◽

2020 ◽

Vol 127 (3) ◽

pp. 035704 ◽

Cited By ~ 1

Author(s):

C. R. Engst ◽

I. Eisele ◽

C. Kutter

Keyword(s):

Current Transient ◽

Defect Characterization ◽

Induced Current ◽

Doped Silicon ◽

Neutron Transmutation ◽

Transient Spectroscopy ◽

Deep Temperature

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Defect Characterization of III-V Quantum Structure Solar Cells Using Photo-Induced Current Transient Spectroscopy

2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) ◽

10.1109/pvsc.2017.8366618 ◽

2017 ◽

Author(s):

Shin-Ichiro Sato ◽

Takeyoshi Sugaya ◽

Tetsuya Nakamura ◽

Takeshi Ohshima

Keyword(s):

Solar Cells ◽

Current Transient ◽

Defect Characterization ◽

Induced Current ◽

Quantum Structure ◽

Transient Spectroscopy

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Photo-Induced Current Transient Spectroscopy of Semi-insulating Single Crystal Cs2Hg6S7

Journal of Electronic Materials ◽

10.1007/s11664-014-3372-2 ◽

2014 ◽

Vol 44 (1) ◽

pp. 222-226 ◽

Cited By ~ 2

Author(s):

Z. Liu ◽

J.A. Peters ◽

H. Li ◽

M. G. Kanatzidis ◽

J. Im ◽

...

Keyword(s):

Single Crystal ◽

Current Transient ◽

Induced Current ◽

Transient Spectroscopy

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Characterization of SIMOX-MOS transistors by photo-induced current transient spectroscopy

Semiconductor Science and Technology ◽

10.1088/0268-1242/6/9/018 ◽

1991 ◽

Vol 6 (9) ◽

pp. 937-939 ◽

Cited By ~ 2

Author(s):

G Papaioannou ◽

B Ioannou-Sougleridis ◽

S Cristoloveanu

Keyword(s):

Current Transient ◽

Induced Current ◽

Mos Transistors ◽

Transient Spectroscopy

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Investigation of deep levels in high-resistivity bulk materials by photo-induced current transient spectroscopy. I. Review and analysis of some basic problems

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/19/1/011 ◽

1986 ◽

Vol 19 (1) ◽

pp. 57-70 ◽

Cited By ~ 85

Author(s):

J C Balland ◽

J P Zielinger ◽

C Noguet ◽

M Tapiero

Keyword(s):

Deep Levels ◽

Current Transient ◽

High Resistivity ◽

Induced Current ◽

Bulk Materials ◽

Transient Spectroscopy

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Photo-Induced Current Transient Spectroscopy in High-Resistivity Bulk Material. I. Computer Controlled Multi-Channel PICTS System with High-Resolution

Japanese Journal of Applied Physics ◽

10.1143/jjap.22.621 ◽

1983 ◽

Vol 22 (Part 1, No. 4) ◽

pp. 621-628 ◽

Cited By ~ 77

Author(s):

Osamu Yoshie ◽

Mitsuo Kamihara

Keyword(s):

High Resolution ◽

Bulk Material ◽

Current Transient ◽

High Resistivity ◽

Induced Current ◽

Computer Controlled ◽

Transient Spectroscopy

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Photo-Induced Current Transient Spectroscopy (PICTS) of Deep Levels in Electrodeposited CdTe Films

phys stat sol (a) ◽

10.1002/(sici)1521-396x(199809)169:1<85::aid-pssa85>3.0.co;2-p ◽

1998 ◽

Vol 169 (1) ◽

pp. 85-96 ◽

Cited By ~ 14

Author(s):

A. E. Rakhshani

Keyword(s):

Deep Levels ◽

Current Transient ◽

Induced Current ◽

Cdte Films ◽

Transient Spectroscopy

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Defect specific topography of GaAs wafers by microwave-detected photo induced current transient spectroscopy

Materials Science and Engineering B ◽

10.1016/s0921-5107(01)01073-x ◽

2002 ◽

Vol 91-92 ◽

pp. 371-375 ◽

Cited By ~ 7

Author(s):

B. Gründig-Wendrock ◽

M. Jurisch ◽

J.R. Niklas

Keyword(s):

Current Transient ◽

Induced Current ◽

Transient Spectroscopy

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Photo-induced current transient spectroscopy of defect clusters in heavily irradiated silicon

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/s0168-9002(02)00546-6 ◽

2002 ◽

Vol 485 (1-2) ◽

pp. 146-152 ◽

Cited By ~ 4

Author(s):

David Menichelli ◽

Mara Bruzzi

Keyword(s):

Current Transient ◽

Induced Current ◽

Defect Clusters ◽

Transient Spectroscopy

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Photo-induced current transient spectroscopy of Al0.48In0.52As semi-insulating layers grown on InP by molecular beam epitaxy

European Materials Research Society Symposia Proceedings - Semiconductor Materials for Optoelectronics and LTMBE Materials, PROCEEDINGS OF SYMPOSIUM A ON SEMICONDUCTOR MATERIALS FOR OPTOELECTRONIC DEVICES, OEICS AND PHOTONICS AND SYMPOSIUM B ON LOW TEMPERATURE MOLECULAR BEAM EPITAXIAL III–V MATERIALS: PHYSICS AND APPLICATIONS OF THE 1993 E-MRS SPRING CONFERENCE ◽

10.1016/b978-0-444-81769-3.50073-5 ◽

1993 ◽

pp. 93-96

Author(s):

A. Kalboussi ◽

G. Marrakchi ◽

A. Tabata ◽

G. Guillot ◽

G. Halkias ◽

...

Keyword(s):

Molecular Beam Epitaxy ◽

Molecular Beam ◽

Current Transient ◽

Induced Current ◽

Transient Spectroscopy

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