scholarly journals Light emission induced by electric current at room temperature through the defect networks of MgO nanocubes

AIP Advances ◽  
2019 ◽  
Vol 9 (12) ◽  
pp. 125305
Author(s):  
Changhyuk Kim ◽  
Peter V. Pikhitsa ◽  
Sukbyung Chae ◽  
Kyungil Cho ◽  
Mansoo Choi
2021 ◽  
Vol 238 ◽  
pp. 111514
Author(s):  
Sergii Golovynskyi ◽  
Oleksandr I. Datsenko ◽  
Luca Seravalli ◽  
Giovanna Trevisi ◽  
Paola Frigeri ◽  
...  

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Licong Peng ◽  
Kosuke Karube ◽  
Yasujiro Taguchi ◽  
Naoto Nagaosa ◽  
Yoshinori Tokura ◽  
...  

AbstractDriving and controlling single-skyrmion motion promises skyrmion-based spintronic applications. Recently progress has been made in moving skyrmionic bubbles in thin-film heterostructures and low-temperature chiral skyrmions in the FeGe helimagnet by electric current. Here, we report the motion tracking and control of a single skyrmion at room temperature in the chiral-lattice magnet Co9Zn9Mn2 using nanosecond current pulses. We have directly observed that the skyrmion Hall motion reverses its direction upon the reversal of skyrmion topological number using Lorentz transmission electron microscopy. Systematic measurements of the single-skyrmion trace as a function of electric current reveal a dynamic transition from the static pinned state to the linear flow motion via a creep event, in agreement with the theoretical prediction. We have clarified the role of skyrmion pinning and evaluated the intrinsic skyrmion Hall angle and the skyrmion velocity in the course of the dynamic transition. Our results pave a way to skyrmion applications in spintronic devices.


2007 ◽  
Vol 90 (2) ◽  
pp. 023110 ◽  
Author(s):  
Hao Huang ◽  
August Dorn ◽  
Vladimir Bulovic ◽  
Moungi G. Bawendi

1996 ◽  
Vol 452 ◽  
Author(s):  
L. Tsybeskov ◽  
K. L. Moore ◽  
P. M. Fauchet ◽  
D. G. Hall

AbstractSilicon-rich silicon oxide (SRSO) films were prepared by thermal oxidation (700°C-950°C) of electrochemically etched crystalline silicon (c-Si). The annealing-oxidation conditions are responsible for the chemical and structural modification of SRSO as well as for the intrinsic light-emission in the visible and near infra-red spectral regions (2.0–1.8 eV, 1.6 eV and 1.1 eV). The extrinsic photoluminescence (PL) is produced by doping (via electroplating or ion implantation) with rare-earth (R-E) ions (Nd at 1.06 μm, Er at 1.5 μm) and chalcogens (S at ∼1.6 μm). The impurities can be localized within the Si grains (S), in the SiO matrix (Nd, Er) or at the Si-SiO interface (Er). The Er-related PL in SRSO was studied in detail: the maximum PL external quantum efficiency (EQE) of 0.01–0.1% was found in samples annealed at 900°C in diluted oxygen (∼ 10% in N2). The integrated PL temperature dependence is weak from 12K to 300K. Light emitting diodes (LEDs) with an active layer made of an intrinsic and doped SRSO are manufactured and studied: room temperature electroluminescence (EL) from the visible to 1.6 μmhas been demonstrated.


2007 ◽  
Vol 121-123 ◽  
pp. 557-560 ◽  
Author(s):  
J. Xu ◽  
Katsunori Makihara ◽  
Hidenori Deki ◽  
Yoshihiro Kawaguchi ◽  
Hideki Murakami ◽  
...  

Light emitting diode with MOS structures containing multiple-stacked Si quantum dots (QDs)/SiO2 was fabricated and the visible-infrared light emission was observed a room temperature when the negative gate bias exceeded the threshold voltage. The luminescence intensity was increased linearly with increasing the injected current density. The possible luminescence mechanism was briefly discussed and the delta P doping was performed to obtain the doped Si QDs and the improvement of EL intensity was demonstrated.


1999 ◽  
Vol 588 ◽  
Author(s):  
S. Pizzini ◽  
S. Binetti ◽  
M. Acciarri ◽  
M. Casati

AbstractIt is well known that the sharp, room temperature luminescence emission at 1.54 μm from dislocated silicon has set off a great interest for this material in view of its applications in the third window of optical telecommunications. For this reason the dislocation related luminescence in silicon addressed recently a number of investigation aimed at understanding the mechanism of light emission. The problem is still unsolved as most of the experiments done gave contradictory answers to the main questions open, which concern the intrinsic or extrinsic nature of dislocation luminescence and the effect on it of reconstruction, interaction or passivation processes, possibly assisted by metallic or non-metallic impurities.In order to go more insight on the problem, we started a systematic work on CZ silicon, aimed at understanding the properties of dislocation luminescence. The identification of the energy levels involved in the different dislocation PL bands has been obtained.


1994 ◽  
Vol 358 ◽  
Author(s):  
T. Komoda ◽  
J.P. Kelly ◽  
A. Nejm ◽  
K.P. Homewood ◽  
P.L.F Hemment ◽  
...  

ABSTRACTImplantation of Si+ ions into thermal oxides grown on silicon has been used to synthesise a two phase structure consisting of Si nanocrystals in a SiO2 matrix. Various processing conditions have been used in order to modify the size and population distributions of the Si inclusions. Photoluminescence spectra have been recorded from samples annealed in nitrogen, forming gas and oxygen. Both red and blue shifts of the luminescence peaks have been observed. It is concluded that the photoluminescence is a consequence of the effects of quantum confinement but is also dependent on the presence of irradiation-induced defects or Si/SiO2 interface states.


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