X-ray imaging represents a very relevant tool in basic and applied research fields due to the possibility of performing non-destructive investigations with high spatial resolution. We present innovative X-ray imaging detectors based on visible photoluminescence from aggregate electronic defects locally created in lithium fluoride (LiF) during irradiation. Among the peculiarities of these detectors, noteworthy ones are their very high spatial resolution (intrinsic ∼2 nm, standard ∼300 nm) across a large field of view (>10 cm2), wide dynamic range (>103) and their insensitivity to ambient light. The material photoluminescence response can be enhanced through the proper choice of reflecting substrates and multi-layer designs in the case of LiF films. The present investigation deals with the most appealing X-ray imaging applications, from simple lensless imaging configurations with commonly-available laboratory polychromatic X-ray sources to X-ray imaging-dedicated synchrotron beamlines in absorption and phase contrast experiments.
Lithium fluoride film detectors for hard X-ray contact microscopy at high spatial resolution