X-ray characterization of Si microstructures with high spatial resolution

2004 ◽  
Vol 95 (4) ◽  
pp. 1662-1666 ◽  
Author(s):  
A. Cedola ◽  
S. Lagomarsino ◽  
F. Scarinci ◽  
M. Servidori ◽  
V. Stanic
2007 ◽  
Vol 80 (1) ◽  
pp. 14-23
Author(s):  
D. A. Winesett ◽  
A. H. Tsou

Abstract Materials of significance in the rubber industry generally consist of a complex blend of elastomers, fillers, curing agents and other additives. Elucidating the complex microstructure-to-property relationship of these materials is essential for optimal product development. This requires characterization techniques that are capable to differentiate, map, and quantify these similar materials with sufficiently high spatial resolution. A technique that can provide such chemical microspeciation is Scanning Transmission X-ray Microscopy (STXM). STXM is a beamline based microscopy that utilizes the chemical specificity of Near Edge X-ray Absorption Fine Structure (NEXAFS) combined with zone plate optics to achieve high spatial resolution (< 50 nm) and low beam damage to allow the successful characterization of multi-component materials that would be difficult or impossible with other techniques. A brief introduction to the technique will be presented along with example applications showing curative and filler distribution mapping in multi-component elastomeric systems.


2019 ◽  
Vol 90 (6) ◽  
pp. 063702
Author(s):  
P. Mabey ◽  
B. Albertazzi ◽  
Th. Michel ◽  
G. Rigon ◽  
S. Makarov ◽  
...  

2012 ◽  
Vol 111 (8) ◽  
pp. 084904 ◽  
Author(s):  
Amrinder S. Gill ◽  
Zhong Zhou ◽  
Ulrich Lienert ◽  
Jonathan Almer ◽  
David F. Lahrman ◽  
...  

2016 ◽  
Vol 43 (6Part1) ◽  
pp. 2731-2740 ◽  
Author(s):  
Jakob C. Larsson ◽  
Ulf Lundström ◽  
Hans M. Hertz

2011 ◽  
Vol 6 (12) ◽  
pp. C12013-C12013 ◽  
Author(s):  
H Kudrolli ◽  
H Bhandari ◽  
M Breen ◽  
V Gelfandbein ◽  
S R Miller ◽  
...  

Radiology ◽  
2015 ◽  
Vol 275 (1) ◽  
pp. 310-310 ◽  
Author(s):  
Richard M. Morris ◽  
Lang Yang ◽  
Miguel A. Martín-Fernández ◽  
Jose M. Pozo ◽  
Alejandro F. Frangi ◽  
...  

Nanomaterials ◽  
2020 ◽  
Vol 10 (9) ◽  
pp. 1721
Author(s):  
Heon Yong Jeong ◽  
Hyung San Lim ◽  
Ju Hyuk Lee ◽  
Jun Heo ◽  
Hyun Nam Kim ◽  
...  

The effect of scintillator particle size on high-resolution X-ray imaging was studied using zinc tungstate (ZnWO4) particles. The ZnWO4 particles were fabricated through a solid-state reaction between zinc oxide and tungsten oxide at various temperatures, producing particles with average sizes of 176.4 nm, 626.7 nm, and 2.127 μm; the zinc oxide and tungsten oxide were created using anodization. The spatial resolutions of high-resolution X-ray images, obtained from utilizing the fabricated particles, were determined: particles with the average size of 176.4 nm produced the highest spatial resolution. The results demonstrate that high spatial resolution can be obtained from ZnWO4 nanoparticle scintillators that minimize optical diffusion by having a particle size that is smaller than the emission wavelength.


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