Characterization of scintillator-based detectors for few-ten-keV high-spatial-resolution x-ray imaging

2016 ◽  
Vol 43 (6Part1) ◽  
pp. 2731-2740 ◽  
Author(s):  
Jakob C. Larsson ◽  
Ulf Lundström ◽  
Hans M. Hertz
Nanomaterials ◽  
2020 ◽  
Vol 10 (9) ◽  
pp. 1721
Author(s):  
Heon Yong Jeong ◽  
Hyung San Lim ◽  
Ju Hyuk Lee ◽  
Jun Heo ◽  
Hyun Nam Kim ◽  
...  

The effect of scintillator particle size on high-resolution X-ray imaging was studied using zinc tungstate (ZnWO4) particles. The ZnWO4 particles were fabricated through a solid-state reaction between zinc oxide and tungsten oxide at various temperatures, producing particles with average sizes of 176.4 nm, 626.7 nm, and 2.127 μm; the zinc oxide and tungsten oxide were created using anodization. The spatial resolutions of high-resolution X-ray images, obtained from utilizing the fabricated particles, were determined: particles with the average size of 176.4 nm produced the highest spatial resolution. The results demonstrate that high spatial resolution can be obtained from ZnWO4 nanoparticle scintillators that minimize optical diffusion by having a particle size that is smaller than the emission wavelength.


2005 ◽  
Author(s):  
Michael R. Squillante ◽  
Richard A. Myers ◽  
Mitchell Woodring ◽  
James F. Christian ◽  
Frank Robertson ◽  
...  

2018 ◽  
Vol 26 (24) ◽  
pp. 31290 ◽  
Author(s):  
Qianli Li ◽  
Xiaolin Liu ◽  
Mu Gu ◽  
Yahua Hu ◽  
Fengrui Li ◽  
...  

2016 ◽  
Vol 98 ◽  
pp. 54-63
Author(s):  
Francesca Bonfigli ◽  
Enrico Nichelatti ◽  
Maria Aurora Vincenti ◽  
Rosa Maria Montereali

X-ray imaging represents a very relevant tool in basic and applied research fields due to the possibility of performing non-destructive investigations with high spatial resolution. We present innovative X-ray imaging detectors based on visible photoluminescence from aggregate electronic defects locally created in lithium fluoride (LiF) during irradiation. Among the peculiarities of these detectors, noteworthy ones are their very high spatial resolution (intrinsic ∼2 nm, standard ∼300 nm) across a large field of view (>10 cm2), wide dynamic range (>103) and their insensitivity to ambient light. The material photoluminescence response can be enhanced through the proper choice of reflecting substrates and multi-layer designs in the case of LiF films. The present investigation deals with the most appealing X-ray imaging applications, from simple lensless imaging configurations with commonly-available laboratory polychromatic X-ray sources to X-ray imaging-dedicated synchrotron beamlines in absorption and phase contrast experiments.


2015 ◽  
Vol 106 (8) ◽  
pp. 081909 ◽  
Author(s):  
Masakazu Kobayashi ◽  
Jun Komori ◽  
Kaiji Shimidzu ◽  
Masanobu Izaki ◽  
Kentaro Uesugi ◽  
...  

2007 ◽  
Vol 80 (1) ◽  
pp. 14-23
Author(s):  
D. A. Winesett ◽  
A. H. Tsou

Abstract Materials of significance in the rubber industry generally consist of a complex blend of elastomers, fillers, curing agents and other additives. Elucidating the complex microstructure-to-property relationship of these materials is essential for optimal product development. This requires characterization techniques that are capable to differentiate, map, and quantify these similar materials with sufficiently high spatial resolution. A technique that can provide such chemical microspeciation is Scanning Transmission X-ray Microscopy (STXM). STXM is a beamline based microscopy that utilizes the chemical specificity of Near Edge X-ray Absorption Fine Structure (NEXAFS) combined with zone plate optics to achieve high spatial resolution (< 50 nm) and low beam damage to allow the successful characterization of multi-component materials that would be difficult or impossible with other techniques. A brief introduction to the technique will be presented along with example applications showing curative and filler distribution mapping in multi-component elastomeric systems.


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