High-frequency dielectric characterization of electronic defect states in co-sputtered W-doped TiO2
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2020 ◽
Vol 31
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pp. 18477-18486
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pp. 1519-1531
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pp. Pr9-113-Pr9-116
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1995 ◽
Vol 131
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pp. 279-285
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2010 ◽
Vol 31
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pp. 353-359