Modified approach for high frequency dielectric characterization of thinly metallized soft polymer film using grounded coplanar waveguide

2015 ◽  
Vol 107 (9) ◽  
pp. 092904 ◽  
Author(s):  
Samuel Baron ◽  
Kevin Nadaud ◽  
Benoit Guiffard ◽  
Ala Sharaiha ◽  
Laurence Seveyrat
2020 ◽  
Vol 31 (21) ◽  
pp. 18477-18486
Author(s):  
Gomasu Sreenu ◽  
Mahfooz Alam ◽  
Didier Fasquelle ◽  
Dibakar Das

2014 ◽  
Vol 1038 ◽  
pp. 63-68 ◽  
Author(s):  
Quang Huy Dao ◽  
Aline Friedrich ◽  
Bernd Geck

This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.


1998 ◽  
Vol 08 (PR9) ◽  
pp. Pr9-113-Pr9-116 ◽  
Author(s):  
C. M. Weil ◽  
R. G. Geyer ◽  
L. Sengupta

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