scholarly journals Current status of nanobeam x-ray diffraction station at SPring-8

2019 ◽  
Author(s):  
Yasuhiko Imai ◽  
Kazushi Sumitani ◽  
Shigeru Kimura
Keyword(s):  
Current Status ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Current status of 50-picosecond resolved x-ray diffraction at Photon Factory Advanced Ring (PF-AR)

2005 ◽  
Vol 21 ◽  
pp. 101-105 ◽  
Author(s):  
Shin-ichi Adachi ◽  
Shunsuke Nozawa ◽  
Ryoko Tazaki ◽  
Jun-ichi Takahashi ◽  
Jiro Itatani ◽  
...  
Keyword(s):  
Current Status ◽  
X Ray Diffraction ◽  
X Ray ◽  
Photon Factory

scholarly journals Current Status of the Liquid-Metal-Jet X-ray Source Technology

2014 ◽  
Vol 70 (a1) ◽  
pp. C1738-C1738
Author(s):  
Emil Espes ◽  
Björn Hansson ◽  
Christina Gratorp ◽  
Oscar Hemberg ◽  
Göran Johansson ◽  
...  
Keyword(s):  
Liquid Metal ◽  
Current Status ◽  
Beam Power ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fundamental Limitations ◽  
Current State ◽  
Reliable Source ◽  
Order Of Magnitude ◽  
Metal Jet

High-end x-ray diffraction and scattering techniques such as high-resolution XRD, protein crystallography, and SAXS rely heavily on the x-ray source brightness for resolution and exposure time. Traditional solid or rotating anode x-ray tubes are typically limited in brightness by when the e-beam power density melts the anode. The liquid-metal-jet technology has overcome this limitation by using an anode that is already in the molten state. We have previously demonstrated prototype performance of a metal-jet anode x-ray source concept [1-3] with unprecedented brightness in the range of one order of magnitude above current state-of-the art sources. The technology has since been developed into a stable and reliable source for home-lab systems This presentation will review the current status of the technology specifically in terms of stability, lifetime, flux and brightness. It will also discuss details of the liquid-metal-jet technology with a focus on the fundamental limitations of the technology. It will furthermore refer to some recent data from applications within x-ray diffraction and SAXS.

D094 Detectors for X-ray Diffraction and Scattering: Current Status and Future Challenges

2005 ◽  
Vol 20 (2) ◽  
pp. 185-185
Author(s):  
L. Brügemann ◽  
E. Gerndt ◽  
A. Kern ◽  
H.-G. Krane ◽  
Y. Diawara ◽  
...  
Keyword(s):  
Current Status ◽  
X Ray Diffraction ◽  
X Ray ◽  
Future Challenges

scholarly journals Роль BiPO4, вводимого через газовую фазу, в процессе создания тонких пленок на поверхности InP

2019 ◽  
Vol 21 (2) ◽  
pp. 215-224
Author(s):  
Victor F. Kostryukov ◽  
Irina Y. Mittova ◽  
Boris V. Sladkopevtsev ◽  
Anna S. Parshina ◽  
Dar’ya S. Balasheva
Keyword(s):  
Indium Phosphide ◽  
Thermal Oxidation ◽  
Electronic Device ◽  
Film Deposition ◽  
Inorganic Materials ◽  
Current Status ◽  
X Ray Diffraction ◽  
Oxide Layers ◽  
X Ray ◽  
Academy Of Sciences

Исследованием термооксидирования фосфида индия под воздействием фосфата висмута, вводимого через газовую фазу, установлено ускоряющее воздействие фосфата висмута на процесс формирования пленок. Величина ускорения составляет от 1.5 до 2 раз, и максимальный прирост пленки достигается в первые 10 мин оксидирования. Определяющим процессом является образование фосфата индия за счет вторичного взаимодействия оксидных форм компонентов подложки, лимитируемое диффузией оксидов в твердой фазе. Методами инфракрасной спектроскопии, локального рентгеноспектрального микроанализа и рентгенофазового анализа установлен состав пленок на поверхности InP, основными компонентами которого являются различные фосфаты индия     REFERENCES Wager J. F., Wilmsen C. W. Thermal oxidation of InP. Appl. Phys., 1980, v. 51(1), pp. 812–814. https://doi.org/10.1063/1.327302 Yamaguchi M., Ando K. Thermal oxidation of InP and properties of oxide fi lm. Appl. Phys., 1980, v. 5(9), pp. 5007–5012. https://doi.org/10.1063/1.3283803. Mittova I. Ya., Borzakova G. V., Terekhov V. A., Mittov O. N, Pshestanchik V. R., Kashkarov V. M. Growth of own oxide layers on indium phosphide. Izvestija AN SSSR. Serija Neorganicheskie Materialy [News of the Academy of Sciences of the USSR. Series Inorganic Materials], 1991, v. 27(10), pp. 2047–2051. (in Russ.) Mittova I. Ya., Borzakova G. V., Terekhov V. A., Mittov O. N, Pshestanchik V. R., Kashkarov V. M. Growth of own oxide layers on indium phosphide. Izvestija AN SSSR. Serija Neorganicheskie Materialy [News of the Academy of Sciences of the USSR. Series Inorganic Materials], 1991, v. 27(10), pp. 2047–2051. (in Russ.) Minaychev V. Ye. Naneseniye plonok v vakuume. [Film deposition in vacuum]. Moscow, Vyssh. Shkola Publ., 1989, 130 p. (in Russ.) Nikitin M. M. Tekhnologiya i oborudovaniye vakuumnogo napyleniya [Technology and equipment for vacuum deposition]. Moscow, Metallurgiya Publ., 1992, 112 p. (in Russ.) Veselov A. A., Veselov A. G., Vysotsky S. L., Dzhumaliyev A. S., Filimonov Yu. A. Magnetic properties of thermally deposited Fe/GaAs (100) thin fi lms. J Technical Physics, 2002, v. 47(8), pp. 1067–1070. https://doi.org/10.1134/1.1501694 Danilin B. S. Magnetronnyye raspylitel’nyye sistemy [Magnetron Spray Systems]. Moscow, Radio i svyaz’ Publ., 1982, 72 p. Pulver D., Wilmsen C.W. Thermal oxides of In0.5Ga0.5P and In0.5Al0.5P. Vac. Sci. Technol. B., 2001, v. 19(1), pp. 207–214. https://doi.org/10.1116/1.1342008 Punkkinen M. P. J., Laukkanen P., Lеng J., Kuzmin M., Tuominen M., Tuominen V., Dahl J., Pessa M., Guina M., Kokko K., Sadowski J., Johansson B., Väyrynen I. J., Vitos L. Oxidized In-containing III–V(100) surfaces: Formation of crystalline oxide fi lms and semiconductor-oxide interfaces. Physical review, 2011, v. 83(19), pp. 195–329. https://doi.org/10.1103/Phys-RevB.83.195329 Sladkopevtsev B. V., Tomina E. V., Mittova I. Ya., Dontsov A. I., Pelipenko D. I. On the thermal oxidation of VxOy–InP heterostructures formed by the centrifugation of vanadium (V) oxide gel. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2016, v. 10(2), pp. 335–340. https://doi.org/10.1134/S102745101602018X Ningyi Y. Comparison of VO2 thin fi lms prepared by inorganic sol-gel and IBED methods. Appl. Phys. A., 2003, v. 78. pp. 777–780. https://doi.org/10.1007/s00339-002-2057-5 Herman M. A., Sitter H. Epitaxy: Fundamentals and Current Status. Heidelberg, Springer Science & Business Media, 2013, 382 p. Manijeh R. The MOCVD Challenge: A survey of GaInAsP–InP and GaInAsP–GaAs for photonic and electronic device applications. Boca Raton, CRC Press, 2010, 799 p. https://doi.org/10.1201/9781439807002 Mittova Ya. Multichannel reactions in chemostimulated oxidation of semiconductors – transit, conjugation, catalysis. Vestnik VGU. Serija: Himija, biologija [Bulletin of the VSU. Series: Chemistry, Biology], 2000, 2, pp. 5–12. (in Russ.) Mittova Ya. Infl uence of the physicochemical nature of chemical stimulators and the way they are introduced into a system on the mechanism of the thermal oxidation of GaAs and InP. Inorganic Materials, 2014, V. 50(9), pp. 874–881. https://doi.org/10.1134/S0020168514090088. Brauer G. A. Rukovodstvo po neorganicheskomu sintezu [Inorganic Synthesis Guide]. Moscow, Khimiya Publ., 1985, 360 с. (in Russ.) Nakamoto K. Infared and Raman Spectra of Inorganic and Coordination Compounds. New York, John Wiley & Sons Ltd, 1986, 335 p. Atlas IK-spektrov fosfatov [Atlas IR spectra of phosphates]. by R.YA. Mel’nikovoy. Moscow, Nauka Publ., 1985, 235 p. (in Russ.) Brandon D., Kaplan W. Microstructural Characterization of Materials. 2nd Edition, John Wiley & Sons Ltd, 2008, 536 p. https://doi.org/10.1002/9780470727133 International Center for Diffraction Data. 21. X-ray diffraction date cards, ASTM. X-ray diffraction date cards, ASTM. Kazenas B.K. Termodinamika ispareniya dvoynykh oksidov. [Thermodynamics of double oxide evaporation]. Мoscow, Nauka Publ., 2004, 551 p. (in Russ.)

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

Ribosome Structural Organization

1974 ◽  
Vol 32 ◽  
pp. 332-333
Author(s):  
James A. Lake
Keyword(s):  
Ribosomal Proteins ◽  
Structural Organization ◽  
Three Dimensional ◽  
Small Subunit ◽  
Structural Studies ◽  
X Ray Diffraction ◽  
Specific Antibodies ◽  
X Ray ◽  
E Coli ◽  
Complete Sequences

The understanding of ribosome structure has advanced considerably in the last several years. Biochemists have characterized the constituent proteins and rRNA's of ribosomes. Complete sequences have been determined for some ribosomal proteins and specific antibodies have been prepared against all E. coli small subunit proteins. In addition, a number of naturally occuring systems of three dimensional ribosome crystals which are suitable for structural studies have been observed in eukaryotes. Although the crystals are, in general, too small for X-ray diffraction, their size is ideal for electron microscopy.

Electron Microscopy of Human Gallstones

1971 ◽  
Vol 29 ◽  
pp. 296-297
Author(s):  
C. Wolpers ◽  
R. Blaschke
Keyword(s):  
Electron Microscopy ◽  
Room Temperature ◽  
Bile Pigment ◽  
X Ray Diffraction ◽  
Triclinic Crystal System ◽  
X Ray ◽  
Follow Up Study ◽  
Infra Red ◽  
Main Components

Scanning microscopy was used to study the surface of human gallstones and the surface of fractures. The specimens were obtained by operation, washed with water, dried at room temperature and shadowcasted with carbon and aluminum. Most of the specimens belong to patients from a series of X-ray follow-up study, examined during the last twenty years. So it was possible to evaluate approximately the age of these gallstones and to get information on the intensity of growing and solving.Cholesterol, a group of bile pigment substances and different salts of calcium, are the main components of human gallstones. By X-ray diffraction technique, infra-red spectroscopy and by chemical analysis it was demonstrated that all three components can be found in any gallstone. In the presence of water cholesterol crystallizes in pane-like plates of the triclinic crystal system.

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