Study of deep traps in AlGaN/GaN high-electron mobility transistors by electrical characterization and simulation
2011 ◽
Vol 326
(1)
◽
pp. 62-64
◽
2016 ◽
Vol 5
(10)
◽
pp. Q260-Q265
◽
2013 ◽
Vol 412
◽
pp. 126-129
◽
2013 ◽
Vol 31
(5)
◽
pp. 051210
◽
2016 ◽
Vol 34
(4)
◽
pp. 041216
◽