scholarly journals Measurement of the non-radiative minority recombination lifetime and the effective radiative recombination coefficient in GaAs

AIP Advances ◽  
2019 ◽  
Vol 9 (4) ◽  
pp. 045034 ◽  
Author(s):  
M. Niemeyer ◽  
P. Kleinschmidt ◽  
A. W. Walker ◽  
L. E. Mundt ◽  
C. Timm ◽  
...  
2016 ◽  
Vol 27 (19) ◽  
pp. 1601741 ◽  
Author(s):  
Chenhao Jin ◽  
Jonghwan Kim ◽  
Kedi Wu ◽  
Bin Chen ◽  
Edward S. Barnard ◽  
...  

2003 ◽  
Vol 763 ◽  
Author(s):  
R. J. Kumar ◽  
R. J. Gutmann ◽  
J.M. Borrego ◽  
P. S. Dutta ◽  
C. A. Wang ◽  
...  

AbstractRadio-frequency (RF) photoreflectance measurements and one-dimensional device simulations have been used to evaluate bulk recombination parameters and surface recombination velocity (SRV) in doubly-capped 0.55-eV p-InGaAsSb epitaxial layers, doped at 2 × 1017 cm-3, for thermophotovoltaic (TPV) applications. Bulk lifetimes of 90 to 100 ns and SRVs of 680 cm/s to 3200 cm/s (depending on the capping layer) are obtained, with higher doping and higher bandgap capping layers most effective in reducing SRV. RF photoreflectance measurements and one-dimensional device simulations are compatible with a radiative recombination coefficient (B) of 3 × 10-11 cm3/s and Auger coefficient (C) of 1 × 10-28 cm6/s.


1996 ◽  
Vol 69 (13) ◽  
pp. 1936-1938 ◽  
Author(s):  
C.‐K. Sun ◽  
S. Keller ◽  
G. Wang ◽  
M. S. Minsky ◽  
J. E. Bowers ◽  
...  

1974 ◽  
Vol 21 (1) ◽  
pp. 357-367 ◽  
Author(s):  
H. Schlangenotto ◽  
H. Maeder ◽  
W. Gerlach

2003 ◽  
Vol 94 (8) ◽  
pp. 4930 ◽  
Author(s):  
T. Trupke ◽  
M. A. Green ◽  
P. Würfel ◽  
P. P. Altermatt ◽  
A. Wang ◽  
...  

2020 ◽  
Vol 124 (38) ◽  
pp. 21123-21128
Author(s):  
Zhida Gao ◽  
Yuanshuang Liu ◽  
Huan Liu ◽  
Cuicui Qiu ◽  
Shaomei Zheng ◽  
...  

2013 ◽  
Vol 423-426 ◽  
pp. 2659-2662
Author(s):  
Hong Liu ◽  
Li Zheng ◽  
Hong Jun Yang ◽  
Wei Yang ◽  
Yong Lin Zheng

The spontaneous radiation energy of the current filaments in high gain GaAs photoconductive semiconductor switches (PCSS) is quantificationally analyzed. The spontaneous radiation formula of the current filaments was derived. The concept of the distribution function of the radiation intensity dependent on radiation wavelength was first introduced in GaAs samples. The radiative recombination coefficients of four peak wavelengths were estimated by the statistical-physical method in high gain GaAs PCSS. Calculated according to the radiative recombination coefficient of 890 nm radiation, the spontaneous radiation energies are consistent with the experimental observations. This explains the observations about optical output energy versus filament current.


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