In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X
2018 ◽
Vol 89
(10)
◽
pp. 10F107
◽
Keyword(s):
X Ray
◽
2014 ◽
Vol 85
(11)
◽
pp. 11E416
◽
2019 ◽
Vol 90
(8)
◽
pp. 083905
◽
2017 ◽
Vol 23
(50)
◽
pp. 12275-12282
◽
2018 ◽
Vol 89
(10)
◽
pp. 10F108
◽
2016 ◽
Vol 87
(11)
◽
pp. 11E318
◽