scholarly journals High performance top gate a-IGZO TFT utilizing siloxane hybrid material as a gate insulator

AIP Advances ◽  
2018 ◽  
Vol 8 (9) ◽  
pp. 095001 ◽  
Author(s):  
Chaiyanan Kulchaisit ◽  
Juan Paolo Soria Bermundo ◽  
Mami N. Fujii ◽  
Yasuaki Ishikawa ◽  
Yukiharu Uraoka
Polymers ◽  
2018 ◽  
Vol 10 (4) ◽  
pp. 449 ◽  
Author(s):  
Yun Kim ◽  
Gwang-Mun Choi ◽  
Jin Bae ◽  
Yong Kim ◽  
Byeong-Soo Bae

RSC Advances ◽  
2021 ◽  
Vol 11 (10) ◽  
pp. 5618-5628
Author(s):  
Wenkai Jiang ◽  
Xinwei Chen ◽  
Tao Wang ◽  
Bolong Li ◽  
Min Zeng ◽  
...  

A high performance gas sensor based on a metal phthalocyanine/graphene quantum dot hybrid material was fabricated for NO2 detection at room-temperature.


Small ◽  
2019 ◽  
Vol 16 (3) ◽  
pp. 1905430 ◽  
Author(s):  
Ge Mu ◽  
Daobin Mu ◽  
Borong Wu ◽  
Chengwei Ma ◽  
Jiaying Bi ◽  
...  

RSC Advances ◽  
2014 ◽  
Vol 4 (86) ◽  
pp. 45742-45748 ◽  
Author(s):  
Byeong-Geun Son ◽  
So Yeon Je ◽  
Hyo Jin Kim ◽  
Jae Kyeong Jeong

2015 ◽  
Vol 137 (40) ◽  
pp. 12946-12953 ◽  
Author(s):  
Qi Fan ◽  
Wen Liu ◽  
Zhe Weng ◽  
Yueming Sun ◽  
Hailiang Wang

Sensors ◽  
2017 ◽  
Vol 17 (9) ◽  
pp. 2070 ◽  
Author(s):  
Bian Wu ◽  
Xingfei Zhang ◽  
Beiju Huang ◽  
Yutong Zhao ◽  
Chuantong Cheng ◽  
...  

2014 ◽  
Vol 670-671 ◽  
pp. 1467-1470
Author(s):  
Ji Feng Shi ◽  
Long Long Chen ◽  
Xiang Sun

Indium-gallium-zinc oxide Thin Film Transistors (IGZO-TFT) were separately prepared with SiOx and SiNx/ SiOx as gate insulator,with IGZO films deposited at room-temperature by RF magnetron sputtering method as active layer.Compared with TFT with SiOx as gate insulator, The saturation mobility and the on/off ratio of TFT with SiNx/ SiOx as gate insulator were much higher. And,the threshold swing was also smaller.But,the threshold voltage was not good enough,was larger. By annealing at 200°C in the air,the saturation mobility increased from 1.42 to 7.5 cm2.V-1.S-1. While, the saturation mobility had no obvious change when TFT was annealed at high temperature. Seriously, IGZO annealed at high temperature would become crystal,it was not good for the ohmic contact between active layer and metal conductive layer,and,the interface between active layer and insulator would be deteriorated.These will result in the threshold swing become larger and the on/off ratio get smaller.200°C is a suitable temperature for annealing. So,using SiNx/ SiOx films as gate insulator,together with TFT annealing at low temperature, could improve the performances of TFT effectively.


2018 ◽  
Vol 10 (9) ◽  
pp. 8102-8109 ◽  
Author(s):  
Jingjing Yu ◽  
Kashif Javaid ◽  
Lingyan Liang ◽  
Weihua Wu ◽  
Yu Liang ◽  
...  

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