Optical functions and critical points of dilute bismide alloys studied by spectroscopic ellipsometry

2018 ◽  
Vol 123 (4) ◽  
pp. 045701 ◽  
Author(s):  
Z. L. Bushell ◽  
R. M. Joseph ◽  
L. Nattermann ◽  
P. Ludewig ◽  
K. Volz ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Critical Points ◽  
Optical Functions

Nitrogen dependence of the GaAsN interband critical points E1 and E1+Δ1 determined by spectroscopic ellipsometry

2000 ◽  
Vol 77 (11) ◽  
pp. 1650-1652 ◽  
Author(s):  
G. Leibiger ◽  
V. Gottschalch ◽  
B. Rheinländer ◽  
J. Šik ◽  
M. Schubert
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Critical Points

Optical functions of Ca-modified PbTiO3 thin films determined by spectroscopic ellipsometry

2000 ◽  
Vol 114 (6) ◽  
pp. 347-350 ◽  
Author(s):  
H Li ◽  
X Tang ◽  
Q Li ◽  
Y Liu ◽  
Z Tang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Functions

Diphenylsiloxane–dimethylsiloxane copolymer: Optical functions from 191 to 1688 nm (0.735–6.491 eV) by spectroscopic ellipsometry

2020 ◽  
Vol 27 (2) ◽  
pp. 026001
Author(s):  
Dhananjay I. Patel ◽  
Dhruv Shah ◽  
Tuhin Roychowdhury ◽  
Joshua I. Wheeler ◽  
Daniel H. Ess ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Functions

Spectroscopic Ellipsometry of the Optical Functions of Some Widely Used Organic Light Emitting Diodes (OLEDs) Materials.

2005 ◽  
Vol 871 ◽  
Author(s):  
Z. T. Liu ◽  
C. C. Oey ◽  
A. B. Djuriši ◽  
C. Y. Kwong ◽  
C. H. Cheung ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Indium Tin Oxide ◽  
High Vacuum ◽  
Light Emitting ◽  
Glass Substrates ◽  
Optical Functions ◽  
Conducting Materials ◽  
Ito Glass ◽  
Polystyrene Sulfonic Acid

AbstractIn this work, optical functions of some widely used OLEDs materials 2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline (BCP), tris (8-hydroxyquinoline) aluminum (Alq3), (N,N′-di(naphthalene-1-yl)-N,N′- diphenylbenzidine (NPB),poly(3,4,-ethylene dioxythiophene):polystyrene sulfonic acid (PEDOT:PSS) and indium tin oxide (ITO)) were studied using spectroscopic ellipsometry (SE) in the spectral range from 1.55 eV to 4.1 eV (wavelength range of 300 nm to 800 nm). The samples were prepared either by thermal evaporation in high vacuum or spin-coating of thin films onto glass substrates. For determination of the optical functions of ITO, commercial ITO glass was used. Measurements at different incident angles were performed to determine whether the samples can be considered isotropic. The SE data were modeled using an oscillator model (Lorentz for semiconducting and Lorentz-Drude for conducting materials). The absorption spectra were also measured, and the comparison with the data determined by SE is given.

Dielectric functions and critical points of BexZn1−xTe alloys measured by spectroscopic ellipsometry

2002 ◽  
Vol 81 (27) ◽  
pp. 5156-5158 ◽  
Author(s):  
M. R. Buckley ◽  
F. C. Peiris ◽  
O. Maksimov ◽  
M. Muñoz ◽  
M. C. Tamargo
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Critical Points

Determination of optical constants of Si/ZnO polycrystalline nanocomposites by spectroscopic ellipsometry

2001 ◽  
Vol 16 (12) ◽  
pp. 3554-3559 ◽  
Author(s):  
J. García-Serrano ◽  
N. Koshizaki ◽  
T. Sasaki ◽  
G. Martínez-Montes ◽  
U. Pal
Keyword(s):  
Film Thickness ◽  
Quartz Glass ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Composite Films ◽  
Two Phase ◽  
Glass Substrates ◽  
Optical Functions ◽  
Substrate Film

The optical constants of Si/ZnO composite films grown on quartz glass substrates were determined in the spectral range 1.5–5.0 eV by spectroscopic ellipsometry using a rotating-analyzer ellipsometer. The structure of the samples was modeled by a two-phase (substrate–film) model, and the optical functions of the film were parameterized through different effective medium approximations. The results allowed us to estimate the microstructural film parameters, such as film thickness, the volume fractions of each of the constituents, and optical constants.

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