Strain measurement in ferromagnetic crystals using dark-field electron holography

2016 ◽  
Vol 109 (19) ◽  
pp. 193102 ◽  
Author(s):  
Yasukazu Murakami ◽  
Kodai Niitsu ◽  
Syuhei Kaneko ◽  
Toshiaki Tanigaki ◽  
Taisuke Sasaki ◽  
...  
Keyword(s):  
Strain Measurement ◽  
Dark Field ◽  
Electron Holography ◽  
Field Electron ◽  
Dark Field Electron

2D strain measurement in sub-10 nm SiGe layer with dark-field electron holography

2015 ◽  
Vol 15 (11) ◽  
pp. 1529-1533 ◽  
Author(s):  
Van Vuong Hoang ◽  
Young Ji Cho ◽  
Jung Ho Yoo ◽  
Jun-Mo Yang ◽  
Sungha Choi ◽  
...  
Keyword(s):  
Strain Measurement ◽  
Sige Layer ◽  
Dark Field ◽  
Electron Holography ◽  
Field Electron ◽  
2D Strain ◽  
Dark Field Electron

Dark field electron holography for strain measurement

2011 ◽  
Vol 111 (3) ◽  
pp. 227-238 ◽  
Author(s):  
A. Béché ◽  
J.L. Rouvière ◽  
J.P. Barnes ◽  
D. Cooper
Keyword(s):  
Strain Measurement ◽  
Dark Field ◽  
Electron Holography ◽  
Field Electron ◽  
Dark Field Electron

Annealed Si∕SiGeC Superlattices Studied by Dark-Field Electron Holography, ToF-SIMS and Infrared Spectroscopy

2011 ◽  
Author(s):  
T. Denneulin ◽  
J. L. Rouvière ◽  
A. Béché ◽  
M. Py ◽  
J. P. Barnes ◽  
...  
Keyword(s):  
Infrared Spectroscopy ◽  
Dark Field ◽  
Electron Holography ◽  
Tof Sims ◽  
Field Electron ◽  
Dark Field Electron

Field mapping of focused ion beam prepared semiconductor devices by off-axis and dark field electron holography

2013 ◽  
Vol 28 (12) ◽  
pp. 125013 ◽  
Author(s):  
David Cooper ◽  
Pierrette Rivallin ◽  
Georges Guegan ◽  
Christophe Plantier ◽  
Eric Robin ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Semiconductor Devices ◽  
Dark Field ◽  
Electron Holography ◽  
Field Mapping ◽  
Field Electron ◽  
Dark Field Electron
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