Annealed Si∕SiGeC Superlattices Studied by Dark-Field Electron Holography, ToF-SIMS and Infrared Spectroscopy
Keyword(s):
Tof Sims
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2016 ◽
Vol 49
(24)
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pp. 244003
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2011 ◽
Vol 326
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pp. 012025
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2017 ◽
Vol 23
(S1)
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pp. 1490-1491
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