Characterization of x-ray framing cameras for the National Ignition Facility using single photon pulse height analysis

2016 ◽  
Vol 87 (11) ◽  
pp. 11D618 ◽  
Author(s):  
J. P. Holder ◽  
L. R. Benedetti ◽  
D. K. Bradley
Keyword(s):  
Single Photon ◽  
Pulse Height ◽  
National Ignition Facility ◽  
X Ray ◽  
Pulse Height Analysis ◽  
Photon Pulse

scholarly journals Crystallographic and Metallurgical Characterization of Radiation Detector Grade Cadmium Telluride Materials

1993 ◽  
Vol 302 ◽  
Author(s):  
C.J. Johnson ◽  
E.E. Eissler ◽  
S.E. Cameron ◽  
Y. Kong ◽  
S. Fan ◽  
...  
Keyword(s):  
Room Temperature ◽  
Radiation Detector ◽  
Pulse Height ◽  
X Ray Diffraction ◽  
Detector Performance ◽  
X Ray ◽  
Pulse Height Analysis ◽  
Dislocation Etch ◽  
Metallurgical Characterization

ABSTRACTRadiation detector grade CdTe crystals are characterized by several crystallographic and metallurgical techniques including infrared microscopy, dislocation etch pitting and X-ray diffraction. Results are presented for 50 detectors fabricated from an ingot produced by the high pressure Bridgman method. Data on the temperature dependence of leakage current and pulse height analysis are presented, along with measurements of room temperature charge transport properties. Attempts to relate crystal structure to detector performance will be discussed.

scholarly journals Crystallographic and Metallurgical Characterization of Radiation Detector Grade Cadmium Telluride Materials

1994 ◽  
Vol 299 ◽  
Author(s):  
C.J. Johnson ◽  
E.E. Eissler ◽  
S.E. Cameron ◽  
Y. Kong ◽  
S. Fan ◽  
...  
Keyword(s):  
Room Temperature ◽  
Radiation Detector ◽  
Pulse Height ◽  
X Ray Diffraction ◽  
Detector Performance ◽  
X Ray ◽  
Pulse Height Analysis ◽  
Dislocation Etch ◽  
Metallurgical Characterization

AbstractRadiation detector grade CdTe crystals are characterized by several crystallographic and metallurgical techniques including infrared microscopy, dislocation etch pitting and X-ray diffraction. Results are presented for 50 detectors fabricated from an ingot produced by the high pressure Bridgman method. Data on the temperature dependence of leakage current and pulse height analysis are presented, along with measurements of room temperature charge transport properties. Attempts to relate crystal structure to detector performance will be discussed.

A new soft x-ray pulse height analysis array in the HL-2A tokamak

2009 ◽  
Vol 80 (12) ◽  
pp. 126104 ◽  
Author(s):  
Y. P. Zhang ◽  
Yi Liu ◽  
J. W. Yang ◽  
X. Y. Song ◽  
M. Liao ◽  
...  
Keyword(s):  
Pulse Height ◽  
X Ray ◽  
Pulse Height Analysis

scholarly journals Chemical Bonding and the Sulfur K X-Ray Spectrum

1965 ◽  
Vol 9 ◽  
pp. 354-364 ◽  
Author(s):  
D. W. Wilbur ◽  
J. W. Gofman
Keyword(s):  
Electronic Structure ◽  
Single Crystal ◽  
Organic Compounds ◽  
Sulfur Atom ◽  
Chemical Bonding ◽  
Proportional Counter ◽  
Pulse Height ◽  
X Ray ◽  
Pulse Height Analysis ◽  
Chemical States

AbstractAn investigation has been made of the relative Kβ intensities in different chemical states of the sulfur atom using the Kα lines, with appropriate corrections, to provide the intensity standards. Both inorganic and organic compounds were included in the study. The data for each compound appear to be reliable to about ± 0.5%, while the whole series of compounds shows a variation greater than 20% in the corrected Kβ/Kα ratios. Energies were also measured, particularly the Kα energies, and their shifts were studied relative to the Kβ, intensity shifts. The work was done with a plane, single-crystal, helium-path spectrometer with proportional counter and pulse-height analysis for detection. The results are indicative of the usefulness of the method both in clarifying an uncertain chemical state and in studying the electronic structure of the bonded atom.

Pulse-Height Selection in X-Ray Fluorescence

1960 ◽  
Vol 4 ◽  
pp. 370-381
Author(s):  
Kurt F.J. Heinrich
Keyword(s):  
Energy Levels ◽  
Pulse Height ◽  
Fluorescence Analysis ◽  
Higher Order ◽  
Pulse Height Analyzer ◽  
X Ray ◽  
Qualitative And Quantitative ◽  
Systematic Application ◽  
Pulse Height Analysis ◽  
Qualitative Work

AbstractPulse-height analysis is a valuable tool in X-ray fluorescence analysis, both for qualitative and quantitative purposes. The elimination of higher order interferences permits determinations that would otherwise be very difficult or impossible, The systematic application of pulse-height analysis in qualitative work greatly simplifies the interpretation of complex spectra. In certain cases one can apply nondispersive analysis, relying on the pulse-height analyzer alone for separating energy levels of X-ray photons. Technique and limitations of pulse-height analysis will be discussed.

scholarly journals X-Ray Emission Analysis by Pulse Height Analysis

RADIOISOTOPES ◽  
1964 ◽  
Vol 13 (5) ◽  
pp. 355-361 ◽  
Author(s):  
Hiroshi IMAMURA ◽  
Kaoru UCHIDA ◽  
Hiroshi TOMINAGA
Keyword(s):  
Pulse Height ◽  
Emission Analysis ◽  
X Ray ◽  
Pulse Height Analysis
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