In vacuo growth studies of Ru thin films on Si, SiN, and SiO2 by high-sensitivity low energy ion scattering

2016 ◽  
Vol 120 (6) ◽  
pp. 065303 ◽  
Author(s):  
R. Coloma Ribera ◽  
R. W. E. van de Kruijs ◽  
J. M. Sturm ◽  
A. E. Yakshin ◽  
F. Bijkerk
2021 ◽  
Vol 28 (1) ◽  
pp. 014201
Author(s):  
Tahereh G. Avval ◽  
Stanislav Průša ◽  
Sean C. Chapman ◽  
Matthew R. Linford ◽  
Tomáš Šikola ◽  
...  

2019 ◽  
Vol 126 (15) ◽  
pp. 155301 ◽  
Author(s):  
C. R. Stilhano Vilas Boas ◽  
J. M. Sturm ◽  
F. Bijkerk

1991 ◽  
Vol 237 ◽  
Author(s):  
F. ShojiK ◽  
K. Sumitomo ◽  
T. Kinoshita ◽  
Y. Tanaka ◽  
K. Oura ◽  
...  

ABSTRACTThe effects of hydrogen adsorption on the growth process and structures of Ag thin films on Si(111)-7×7 surfaces has been studied. The growth process and film structures are investigated by low energy electron diffraction(LEED) and low energy ion scattering spectroscopy of time of flight mode(TOF-ICISS). The hydrogen adsorbed on the surface is investigated by low energy recoil detection analysis(TOF-ERDA). We have found that Ag thin films deposited onto hydrogen covered Si(111) surfaces grow with a mode definitely different from that on clean surfaces.


2014 ◽  
Vol 5 (11) ◽  
pp. 4404-4418 ◽  
Author(s):  
Ignacio J. Villar-Garcia ◽  
Sarah Fearn ◽  
Gilbert F. De Gregorio ◽  
Nur L. Ismail ◽  
Florence J. V. Gschwend ◽  
...  

We have identified elements present in the ionic liquid–vacuum outer atomic surface of 23 ionic liquids using high sensitivity low-energy ion scattering (LEIS), a very surface sensitive technique.


2019 ◽  
Vol 26 (2) ◽  
pp. 024201 ◽  
Author(s):  
Tahereh G. Avval ◽  
Cody V. Cushman ◽  
Philipp Brüner ◽  
Thomas Grehl ◽  
Hidde H. Brongersma ◽  
...  

2009 ◽  
Vol 140 (3-4) ◽  
pp. 197-201 ◽  
Author(s):  
H.R.J. ter Veen ◽  
T. Kim ◽  
I.E. Wachs ◽  
H.H. Brongersma

Langmuir ◽  
2013 ◽  
Vol 29 (46) ◽  
pp. 14301-14306 ◽  
Author(s):  
Alan Kauling ◽  
Günter Ebeling ◽  
Jonder Morais ◽  
Agílio Pádua ◽  
Thomas Grehl ◽  
...  

2020 ◽  
Vol 52 (12) ◽  
pp. 1000-1003
Author(s):  
Stanislav Průša ◽  
Pavel Bábík ◽  
Tomáš Šikola ◽  
Hidde H. Brongersma

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