In situ surface and interface study of crystalline (3×1)-O on InAs

2016 ◽  
Vol 109 (4) ◽  
pp. 041601 ◽  
Author(s):  
Xiaoye Qin ◽  
Wei-E. Wang ◽  
Mark S. Rodder ◽  
Robert M. Wallace
Keyword(s):  
Surface And Interface ◽  
Interface Study

scholarly journals In-situ surface and interface study of atomic oxygen modified carbon containing porous low-κ dielectric films for barrier layer applications

2016 ◽  
Vol 120 (10) ◽  
pp. 105305 ◽  
Author(s):  
J. Bogan ◽  
R. Lundy ◽  
A. P. McCoy ◽  
R. O'Connor ◽  
C. Byrne ◽  
...  
Keyword(s):  
Barrier Layer ◽  
Atomic Oxygen ◽  
Dielectric Films ◽  
Surface And Interface ◽  
Interface Study

Nucleation and initial growth of Pd2Si crystals on Si(111)

1993 ◽  
Vol 51 ◽  
pp. 844-845
Author(s):  
Xianghong Tong ◽  
Oliver Pohland ◽  
J. Murray Gibson
Keyword(s):  
High Vacuum ◽  
Dark Field ◽  
Ultra High Vacuum ◽  
Initial Growth ◽  
Surface And Interface ◽  
Dark Field Imaging ◽  
Transmission Electron ◽  
Initial Stage ◽  
Effect Of Surface

The nucleation and initial stage of Pd2Si crystals on Si(111) surface is studied in situ using an Ultra-High Vacuum (UHV) Transmission Electron Microscope (TEM). A modified JEOL 200CX TEM is used for the study. The Si(111) sample is prepared by chemical thinning and is cleaned inside the UHV chamber with base pressure of 1x10−9 τ. A Pd film of 20 Å thick is deposited on to the Si(111) sample in situ using a built-in mini evaporator. This room temperature deposited Pd film is thermally annealed subsequently to form Pd2Si crystals. Surface sensitive dark field imaging is used for the study to reveal the effect of surface and interface steps.The initial growth of the Pd2Si has three stages: nucleation, growth of the nuclei and coalescence of the nuclei. Our experiments shows that the nucleation of the Pd2Si crystal occurs randomly and almost instantaneously on the terraces upon thermal annealing or electron irradiation.

Surface and interface study of cermet coatings on aluminized steel by XPS

2010 ◽  
Vol 42 (6-7) ◽  
pp. 1172-1175 ◽  
Author(s):  
R. Romero ◽  
F. Martin ◽  
J. R. Ramos-Barrado ◽  
D. Leinen
Keyword(s):  
Cermet Coatings ◽  
Surface And Interface ◽  
Aluminized Steel ◽  
Interface Study

PEEM AND SXES CHARACTERIZATION ON THE SURFACE AND INTERFACE OF THE TRANSITION-METAL/SiC SYSTEM

2002 ◽  
Vol 09 (01) ◽  
pp. 313-318
Author(s):  
JOSELITO LABIS ◽  
AKIHIKO OHI ◽  
CHIHIRO KAMEZAWA ◽  
TOSHINORI FUJIKI ◽  
KENICHI YOSHIDA ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Heat Treatment ◽  
Transition Metal ◽  
Emission Spectroscopy ◽  
Emission Spectra ◽  
Photoemission Electron Microscopy ◽  
X Ray ◽  
Surface And Interface ◽  
Photoemission Electron

The Si L2,3 and C K soft X-ray emission spectra of the interface of the Ti(50 nm)/4H-SiC(substrate) system, thermally annealed from 800°C to 1000°C and characterized by soft X-ray emission spectroscopy (SXES), revealed the formation of a reacted region composed of silicides with Ti 5 Si 3 as the majority formed species and carbides in TiC-like bonding. Also, the photoemission electron microscopy (PEEM) imaging of Ti(10 nm) film on 3C-SiC surface during in situ heat treatment showed the formation of island structures (in ring clusters) at ~ 800°C.

Surface and Interface Study of Titanium Nitride on Si Substrate Produced by Dynamic Ion Beam Mixing Method

1994 ◽  
Vol 33 (Part 1, No. 4A) ◽  
pp. 2025-2030 ◽  
Author(s):  
Young Whoan Beag ◽  
Masayoshi Tarutani ◽  
Kyung-youl Min ◽  
Masato Kiuchi ◽  
Ryuichi Shimizu
Keyword(s):  
Titanium Nitride ◽  
Ion Beam ◽  
Si Substrate ◽  
Ion Beam Mixing ◽  
Surface And Interface ◽  
Mixing Method ◽  
Interface Study

scholarly journals Dramatic Effect of Temperature on Metal-oxide Nanostructures: Oxidation of Cu Films by In situ UHV-TEM

2002 ◽  
Vol 739 ◽  
Author(s):  
Guangwen Zhou ◽  
Judith C. Yang
Keyword(s):  
Three Dimensional ◽  
Oxidation Temperature ◽  
Effect Of Temperature ◽  
Observation Data ◽  
Cu Films ◽  
Surface And Interface ◽  
Aspect Ratios ◽  
Oxide Nanostructures ◽  
Metal Oxide Nanostructures

ABSTRACTWe investigated the temperature effect on the Cu2O morphology by oxidizing Cu(100) thin films at the temperature ranging from 350°C to 1000°C. We demonstrated that dramatically different morphologies of oxide nanostructures can be achieved by modifying the oxidation temperature. Quasi-one-dimensional Cu2O structures with aspect ratios as large as 40:1 were formed at the oxidation temperature of 600°C. The in situ observation data on the elongation of Cu2O islands agree with the energetic calculations based on the balance between surface and interface energies and the elastic stress relaxation in the three dimensional islands.

scholarly journals X-ray reflectivity study of the glass transition temperature of thin films

2014 ◽  
Vol 70 (a1) ◽  
pp. C885-C885
Author(s):  
Krassimir Stoev ◽  
Kenji Sakurai
Keyword(s):  
Thin Films ◽  
Glass Transition ◽  
Transition Temperature ◽  
Glass Transition Temperature ◽  
Amorphous Materials ◽  
Bulk Material ◽  
Grazing Incidence ◽  
X Ray ◽  
Surface And Interface

The glass transition takes place in amorphous materials (like polymers) during heating or cooling, and can be described as reversible transition from a hard and brittle state into a rubber-like state. Although physical properties of the material change significantly during the glass transition, this is not a phase transition of the material. The temperature at which the transition between the glassy and rubbery state occurs is called the glass transition temperature, and this temperature is always lower than the melting temperature. Thermodynamically, the glass transition is associated with transfer of heat between the system and its surrounding and with an abrupt volume change. Previously it was shown that the glass transition temperature of nano-films is different from that of bulk materials [1], which signifies the importance of determining this parameter for such systems. In the current work, we use quick X-ray reflectivity (qXRR) measurements to determine the glass transition temperature of polyvinyl acetate (PVAc). PVAc is rubbery synthetic polymer with the formula (C4H6O2), a density of 1.18 g/cm3, and a glass transition temperature for bulk material of 30oC [2]. Regular X-ray reflectivity measurements are based on θ/2θ scans at grazing incidence and typically require 0.5-1.5 h for a single scan. The qXRR technique is based on simultaneous measurement of the whole angular x-ray reflectivity profile and is suitable for in-situ measurement without moving the sample and/or the x-ray optics. Thus, the qXRR technique allows for very fast measurement of the x-ray reflectivity curves (duration of each scan is typically 0.1–20 sec [3]), which permits studying the time evolution of chemical, thermal, and mechanical changes at the surface and interface of different materials. X-ray reflectivity measurements give information about both density and thickness of thin films, and are suitable for studying glass transition phenomena. Nano-thickness PVAc layers on a Si substrate were examined with the qXRR technique, with x-ray reflectivity scans (each 10-seconds in duration) being recorded while temperature was changed from 20 to 50oC (total of 331 scans over 7 hours and 46 minutes). In the current paper, the experimental setup, the data-processing, and the analysis of the results from the qXRR measurements will be presented.

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