scholarly journals Passive microrheology of soft materials with atomic force microscopy: A wavelet-based spectral analysis

2016 ◽  
Vol 108 (3) ◽  
pp. 034102 ◽  
Author(s):  
C. Martinez-Torres ◽  
A. Arneodo ◽  
L. Streppa ◽  
P. Argoul ◽  
F. Argoul
Keyword(s):  
Atomic Force Microscopy ◽  
Spectral Analysis ◽  
Soft Materials ◽  
Force Microscopy ◽  
Atomic Force

Direct Writing on Phosphate Glass Using Atomic Force Microscopy for Rapid Fabrication of Nanostructures

2016 ◽  
Author(s):  
Shama F. Barna ◽  
Kyle E. Jacobs ◽  
Glennys A. Mensing ◽  
Placid M. Ferreira
Keyword(s):  
Atomic Force Microscopy ◽  
Ion Beam ◽  
Soft Materials ◽  
Constant Current ◽  
Silver Nanostructures ◽  
Direct Writing ◽  
Ambient Conditions ◽  
Commercial Development ◽  
Force Microscopy ◽  
Atomic Force

Rapid and cost effective fabrication of nanostructures is critical for experimental exploration and translation of results for commercial development. While conventional techniques such as E-beam or Focused Ion beam lithography serve some prototyping needs for nano-scale experimentations, cost and rate considerations prohibit use for manufacturing. Specialized lithographic processes [e.g. nanosphere lithography or interference lithography] are also powerful tools in creating nanostructures but provide limited shapes, positioning and size control of nanostructures. In this work, we demonstrated a liquid-free and mask-less electrochemical writing approach using atomic force microscopy (AFM) that is capable of making arbitrary shapes of silver nanostructures in seconds on a solid state super-ionic (AgI)x (AgPO3)(1−x) glass. Under ambient conditions. silver is extracted selectively on super-ionic (AgI)x (AgPO3)(1−x) glass surface by negatively biasing an AFM probe relative to an Ag film counter electrode. Both voltage controlled and current controlled writings demonstrated localized extraction of silver. The current controlled approach is shown to be the preferred writing approach to make repeatable and uniform patterns of silver on (AgI)x AgPO3(1−x), where x represents the mole fraction of AgI in the mixture and the control parameter that tunes the conductivity of the sample. We demonstrated current controlled printing of silver on two different compositions of the material (i.e. (AgI)0.125 (AgPO3 )0.875 and (AgI)0.25(AgPO3)0.75 ). Depending on the magnitude of the constant current and tip speed, line-width of the silver pattern can be ∼150 nm. The length of these patterns are limited to the maximum distance the tip can be moved using the AFM position controls. The substrate being optically transparent allows the use of this writing technique for rapid prototyping plasmonic devices. By using the patterned substrate as a template for replica molding of soft materials such as polydimethylsiloxane (PDMS), this writing technique can also be utilized for high throughput nano-channel fabrication in biofluidics and microfluidics devices.

scholarly journals Atomic force microscopy methodology and AFMech Suite software for nanomechanics on heterogeneous soft materials

2018 ◽  
Vol 9 (1) ◽  
Author(s):  
Massimiliano Galluzzi ◽  
Guanlin Tang ◽  
Chandra S. Biswas ◽  
Jinlai Zhao ◽  
Shiguo Chen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Soft Materials ◽  
Force Microscopy ◽  
Atomic Force

Imaging Elastic Properties of Soft Materials Immersed in Water Using Force Modulation Mode in Atomic Force Microscopy

1998 ◽  
Vol 37 (Part 1, No. 6B) ◽  
pp. 3860-3863 ◽  
Author(s):  
Hisashi Haga ◽  
Shigeo Sasaki ◽  
Mayumi Morimoto ◽  
Kazushige Kawabata ◽  
Etsuro Ito ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Properties ◽  
Soft Materials ◽  
Force Microscopy ◽  
Force Modulation ◽  
Atomic Force ◽  
Modulation Mode

Spectral Analysis of Irregular Roughness Artifacts Measured by Atomic Force Microscopy and Laser Scanning Microscopy

2014 ◽  
Vol 20 (6) ◽  
pp. 1682-1691 ◽  
Author(s):  
Yuhang Chen ◽  
Tingting Luo ◽  
Chengfu Ma ◽  
Wenhao Huang ◽  
Sitian Gao
Keyword(s):  
Atomic Force Microscopy ◽  
Spectral Analysis ◽  
Template Matching ◽  
Laser Scanning ◽  
Laser Scanning Microscopy ◽  
Scanning Microscopy ◽  
Height Distribution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Autocorrelation Length

AbstractAtomic force microscopy (AFM) and laser scanning microscopy (LSM) measurements on a series of specially designed roughness artifacts were performed and the results characterized by spectral analysis. As demonstrated by comparisons, both AFM and LSM can image the complex structures with high resolution and fidelity. When the surface autocorrelation length increases from 200 to 500 nm, the cumulative power spectral density spectra of the design, AFM and LSM data reach a better agreement with each other. The critical wavelength of AFM characterization is smaller than that of LSM, and the gap between the measured and designed critical wavelengths is reduced with an increase in the surface autocorrelation length. Topography measurements of surfaces with a near zero or negatively skewed height distribution were determined to be accurate. However, obvious discrepancies were found for surfaces with a positive skewness owing to more severe dilations of either the solid tip of the AFM or the laser tip of the LSM. Further surface parameter evaluation and template matching analysis verified that the main distortions in AFM measurements are tip dilations while those in LSM are generally larger and more complex.

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