scholarly journals Atomic force microscopy methodology and AFMech Suite software for nanomechanics on heterogeneous soft materials

2018 ◽  
Vol 9 (1) ◽  
Author(s):  
Massimiliano Galluzzi ◽  
Guanlin Tang ◽  
Chandra S. Biswas ◽  
Jinlai Zhao ◽  
Shiguo Chen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Soft Materials ◽  
Force Microscopy ◽  
Atomic Force

Direct Writing on Phosphate Glass Using Atomic Force Microscopy for Rapid Fabrication of Nanostructures

2016 ◽  
Author(s):  
Shama F. Barna ◽  
Kyle E. Jacobs ◽  
Glennys A. Mensing ◽  
Placid M. Ferreira
Keyword(s):  
Atomic Force Microscopy ◽  
Ion Beam ◽  
Soft Materials ◽  
Constant Current ◽  
Silver Nanostructures ◽  
Direct Writing ◽  
Ambient Conditions ◽  
Commercial Development ◽  
Force Microscopy ◽  
Atomic Force

Rapid and cost effective fabrication of nanostructures is critical for experimental exploration and translation of results for commercial development. While conventional techniques such as E-beam or Focused Ion beam lithography serve some prototyping needs for nano-scale experimentations, cost and rate considerations prohibit use for manufacturing. Specialized lithographic processes [e.g. nanosphere lithography or interference lithography] are also powerful tools in creating nanostructures but provide limited shapes, positioning and size control of nanostructures. In this work, we demonstrated a liquid-free and mask-less electrochemical writing approach using atomic force microscopy (AFM) that is capable of making arbitrary shapes of silver nanostructures in seconds on a solid state super-ionic (AgI)x (AgPO3)(1−x) glass. Under ambient conditions. silver is extracted selectively on super-ionic (AgI)x (AgPO3)(1−x) glass surface by negatively biasing an AFM probe relative to an Ag film counter electrode. Both voltage controlled and current controlled writings demonstrated localized extraction of silver. The current controlled approach is shown to be the preferred writing approach to make repeatable and uniform patterns of silver on (AgI)x AgPO3(1−x), where x represents the mole fraction of AgI in the mixture and the control parameter that tunes the conductivity of the sample. We demonstrated current controlled printing of silver on two different compositions of the material (i.e. (AgI)0.125 (AgPO3 )0.875 and (AgI)0.25(AgPO3)0.75 ). Depending on the magnitude of the constant current and tip speed, line-width of the silver pattern can be ∼150 nm. The length of these patterns are limited to the maximum distance the tip can be moved using the AFM position controls. The substrate being optically transparent allows the use of this writing technique for rapid prototyping plasmonic devices. By using the patterned substrate as a template for replica molding of soft materials such as polydimethylsiloxane (PDMS), this writing technique can also be utilized for high throughput nano-channel fabrication in biofluidics and microfluidics devices.

Imaging Elastic Properties of Soft Materials Immersed in Water Using Force Modulation Mode in Atomic Force Microscopy

1998 ◽  
Vol 37 (Part 1, No. 6B) ◽  
pp. 3860-3863 ◽  
Author(s):  
Hisashi Haga ◽  
Shigeo Sasaki ◽  
Mayumi Morimoto ◽  
Kazushige Kawabata ◽  
Etsuro Ito ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Properties ◽  
Soft Materials ◽  
Force Microscopy ◽  
Force Modulation ◽  
Atomic Force ◽  
Modulation Mode

Quantitative Measurement of the Mechanical Contribution to Tapping-Mode Atomic Force Microscopy Images of Soft Materials

Langmuir ◽  
2000 ◽  
Vol 16 (22) ◽  
pp. 8432-8437 ◽  
Author(s):  
S. Kopp-Marsaudon ◽  
Ph. Leclère ◽  
F. Dubourg ◽  
R. Lazzaroni ◽  
J. P. Aimé
Keyword(s):  
Atomic Force Microscopy ◽  
Quantitative Measurement ◽  
Soft Materials ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Images ◽  
Mode Atomic Force Microscopy

An Atomic Force Microscopy Indentation Study of Biomaterial Properties

2005 ◽  
Author(s):  
E. J. Berger ◽  
S. Tripathy ◽  
K. Vemaganti ◽  
Y. M. Kolambkar ◽  
H. X. You ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Soft Materials ◽  
Data Interpretation ◽  
Close Relative ◽  
Small Scale ◽  
Force Microscopy ◽  
Afm Indentation ◽  
Atomic Force ◽  
Biomechanical Investigation ◽  
Series Type

Atomic force microscopy (AFM) is a powerful and increasingly common modality of biomechanical investigation, including imaging, force spectroscopy, and microrheology. AFM indentation of biomaterials requires use of a contact model for data interpretation and material property extraction, and a large segment of the scientific community uses the Hertz model or a close relative for small-scale indentation of thin, soft materials in high strain applications. We present experimental results and analytical/numerical modeling which lead to two main conclusions: (i) Hertzian mechanics are useful in a surprisingly large parameter range, including scenarios in which the underlying assumptions are seemingly violated, and (ii) the Hertz solution serves as a useful base from which power-series type solutions can be derived for a variety of non-Hertzian effects.

2P317 Quantification of the size of nanoparticles on soft materials using atomic force microscopy

2005 ◽  
Vol 45 (supplement) ◽  
pp. S199
Author(s):  
K. Oikawa ◽  
H. Kim ◽  
A. Kira ◽  
K. Okano ◽  
K. Yasuda
Keyword(s):  
Atomic Force Microscopy ◽  
Soft Materials ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Passive microrheology of soft materials with atomic force microscopy: A wavelet-based spectral analysis

2016 ◽  
Vol 108 (3) ◽  
pp. 034102 ◽  
Author(s):  
C. Martinez-Torres ◽  
A. Arneodo ◽  
L. Streppa ◽  
P. Argoul ◽  
F. Argoul
Keyword(s):  
Atomic Force Microscopy ◽  
Spectral Analysis ◽  
Soft Materials ◽  
Force Microscopy ◽  
Atomic Force
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