Kinetics study of the evolution of oxygen-related defects in mono-crystalline silicon subjected to electron-irradiation and thermal treatment

2015 ◽  
Vol 118 (13) ◽  
pp. 135703 ◽  
Author(s):  
V. Quemener ◽  
B. Raeissi ◽  
F. Herklotz ◽  
L. I. Murin ◽  
E. V. Monakhov ◽  
...  
Keyword(s):  
Thermal Treatment ◽  
Electron Irradiation ◽  
Crystalline Silicon ◽  
Kinetics Study ◽  
Evolution Of Oxygen

Structural Properties of Amorphous Silicon Produced by Electron Irradiation

1999 ◽  
Vol 557 ◽  
Author(s):  
J. Yamasaki ◽  
S. Takeda
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Distribution Function ◽  
Structural Properties ◽  
Electron Irradiation ◽  
Low Temperatures ◽  
Crystalline Silicon ◽  
Transmission Electron ◽  
Amorphous Si ◽  
Means Of Transmission

AbstractThe structural properties of the amorphous Si (a-Si), which was created from crystalline silicon by 2 MeV electron irradiation at low temperatures about 25 K, are examined in detail by means of transmission electron microscopy and transmission electron diffraction. The peak positions in the radial distribution function (RDF) of the a-Si correspond well to those of a-Si fabricated by other techniques. The electron-irradiation-induced a-Si returns to crystalline Si after annealing at 550°C.

Physical and electrical characterization of TiO2 particles after high temperature processing and before and after ultraviolet irradiation

2014 ◽  
Vol 92 (7/8) ◽  
pp. 832-837
Author(s):  
J. Molina ◽  
C. Zúñiga ◽  
M. Moreno ◽  
W. Calleja ◽  
P. Rosales ◽  
...  
Keyword(s):  
High Temperature ◽  
Thermal Treatment ◽  
Uv Irradiation ◽  
Silicon Oxide ◽  
Crystalline Silicon ◽  
Electrical Characterization ◽  
Metal Electrode ◽  
Rutile Phase ◽  
Before And After ◽  
Diffraction Patterns

In this work, rutile-phase TiO2 particles (r-TiO2, about 360 nm in size) are embedded within a silicon oxide matrix using different concentration ratios of r-TiO2 with respect to SiO2:H2O, so that suspensions of mixed TiO2:SiO2 oxides were obtained and analyzed. These TiO2:SiO2 suspensions were deposited on previously-cleaned crystalline silicon and quartz substrates so that thin films of TiO2:SiO2 were obtained. All films were then exposed to relatively high-temperature thermal treatments in nitrogen and different characterization techniques were used to determine their physical and electrical properties before and after ultraviolet (UV) irradiation. Before high thermal treatment, X-ray diffraction patterns show that the main diffraction peaks for the obtained TiO2:SiO2 films correspond to the crystalline phase of rutile-TiO2. Infrared analyses before and after thermal treatment show significant changes in the chemical bonding of the final films relative to the temperatures used during annealing. Also, UV–visible spectra provide a constant optical band gap for the films, independent of different TiO2 concentrations as expected. On the other hand, atomic-force microscopy measurements before and after UV irradiation show an appreciable difference in the grain size and surface morphology of the resulting TiO2:SiO2 oxides annealed at 1000 °C. Finally, photoelectrical I–V properties were obtained for all TiO2:SiO2 films by depositing ultrathin titanium stripes on top of the photoactive material and then, measuring the total current flowing through the metal electrode before and after UV irradiation. From these last measurements, a detectable increase in the I–V slope (lower resistance of the titanium stripe) is found for all samples during UV exposure, thus making this device to act as a simple photoresistor based on r-TiO2 particles.

Photocurrent Enhancement Induced By Interface Modifications Due To Low Dose Electron Irradiation Of Amorphous∕Crystalline Silicon Heterojunctions

2010 ◽  
Author(s):  
Heinz-Christoph Neitzert ◽  
Manuela Ferrara ◽  
Wolfgang Fahrner ◽  
Maximilian Scherff ◽  
Arjen Klaver ◽  
...  
Keyword(s):  
Electron Irradiation ◽  
Low Dose ◽  
Crystalline Silicon ◽  
Silicon Heterojunctions

scholarly journals PHOTOVOLTAIC MODULE RECYCLING: THERMAL TREATMENT TO DEGRADE POLYMERS AND CONCENTRATE VALUABLE METALS

Detritus ◽  
2021 ◽  
pp. 48-62
Author(s):  
Priscila Silva Silveira Camargo ◽  
Andrey da Silva Domingues ◽  
João Pedro Guê Palomero ◽  
Angela Cristina Kasper ◽  
Pablo Ribeiro Dias ◽  
...  
Keyword(s):  
Thermal Treatment ◽  
Crystalline Silicon ◽  
Chemical Characterization ◽  
Ambient Air ◽  
Photovoltaic Module ◽  
P Value ◽  
High Concentration ◽  
Photovoltaic Modules ◽  
Valuable Metals ◽  
Hazardous Metal

ABSTRACT: This work investigated the thermal treatment to separate and concentrate economically valuable materials from laminates of crystalline silicon photovoltaic modules (i.e., photovoltaic modules without the aluminum frame and the junction box). Chemical characterization of the metal content was performed by X-Ray Fluorescence (XRF). The polymers of the backsheet were also characterized by Fourier Transform Infrared Spectroscopy (FTIR). The influence of the atmosphere (oxidizing and inert) on the decomposition of the backsheet was investigated by Thermogravimetric Analysis (TGA). Moreover, non-comminuted samples were tested for 4 thermal time lengths (30, 60, 90, and 120 min) in the furnace under ambient air. The degradation of the polymers was measured and 3 material fractions were obtained: silicon with silver and residual polymers (SS), glass and copper ribbons. Furthermore, there was no statistical difference between the mass losses of the samples submitted for 90 (13.62 ± 0.02 wt.%) and 120 min at 500 °C (p-value = 0.062). In the SS fraction, silver was 20 times more concentrated than in the ground photovoltaic laminate and 30 times more concentrated than high silver concentration ores. The SS fraction (about 6 wt.%) also presented low copper concentration and a high concentration of lead (hazardous metal). About 79 wt.% glass was obtained, as well as 1% copper ribbons (55.69 ± 6.39% copper, 23.17 ± 7.51% lead, 16.06 ± 2.12% tin). The limitations of the treatment and its environmental impact are discussed, and suggestions for industrial-scale application are given.

Evaluation of single-electron movies of glutamine synthetase molecules

1983 ◽  
Vol 41 ◽  
pp. 280-281
Author(s):  
W. Kunath ◽  
E. Zeitler ◽  
M. Kessel
Keyword(s):  
Electron Microscope ◽  
Glutamine Synthetase ◽  
Electron Irradiation ◽  
Structural Damage ◽  
Structural Changes ◽  
Single Electron ◽  
Continuous Series ◽  
Digital Recording ◽  
Recording Device ◽  
Low Exposure

The features of digital recording of a continuous series (movie) of singleelectron TV frames are reported. The technique is used to investigate structural changes in negatively stained glutamine synthetase molecules (GS) during electron irradiation and, as an ultimate goal, to look for the molecules' “undamaged” structure, say, after a 1 e/Å2 dose.The TV frame of fig. la shows an image of 5 glutamine synthetase molecules exposed to 1/150 e/Å2. Every single electron is recorded as a unit signal in a 256 ×256 field. The extremely low exposure of a single TV frame as dictated by the single-electron recording device including the electron microscope requires accumulation of 150 TV frames into one frame (fig. lb) thus achieving a reasonable compromise between the conflicting aspects of exposure time per frame of 3 sec. vs. object drift of less than 1 Å, and exposure per frame of 1 e/Å2 vs. rate of structural damage.

Pollutant Identification by Selected Area Electron Diffraction

1974 ◽  
Vol 32 ◽  
pp. 532-533
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson ◽  
C. W. Walker
Keyword(s):  
Thermal Treatment ◽  
Electron Diffraction ◽  
Sample Preparation ◽  
Crystal Structures ◽  
Water Samples ◽  
Environmental Samples ◽  
Short Review ◽  
Selected Area Electron Diffraction ◽  
Multiple Component

Selected area electron diffraction (SAD) has been used successfully to determine crystal structures, identify traces of minerals in rocks, and characterize the phases formed during thermal treatment of micron-sized particles. There is an increased interest in the method because it has the potential capability of identifying micron-sized pollutants in air and water samples. This paper is a short review of the theory behind SAD and a discussion of the sample preparation employed for the analysis of multiple component environmental samples.

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