Roles of grain boundaries on the semiconductor to metal phase transition of VO2 thin films

2015 ◽  
Vol 107 (10) ◽  
pp. 102105 ◽  
Author(s):  
Jie Jian ◽  
Wenrui Zhang ◽  
Clement Jacob ◽  
Aiping Chen ◽  
Han Wang ◽  
...  
2019 ◽  
Vol 10 (4) ◽  
pp. 775-780 ◽  
Author(s):  
D. P. Lelyuk ◽  
A. D. Mishin ◽  
S. S. Maklakov ◽  
A. M. Makarevich ◽  
D. I. Sharovarov

Nanoscale ◽  
2020 ◽  
Vol 12 (2) ◽  
pp. 851-863 ◽  
Author(s):  
Tiziana Cesca ◽  
Carlo Scian ◽  
Emilija Petronijevic ◽  
Grigore Leahu ◽  
Roberto Li Voti ◽  
...  

In situ XRD and IR optical measurements demonstrate the coexistence of M1 and R phases during the SMT transition of VO2 thin films.


2005 ◽  
Vol 87 (5) ◽  
pp. 051910 ◽  
Author(s):  
D. Brassard ◽  
S. Fourmaux ◽  
M. Jean-Jacques ◽  
J. C. Kieffer ◽  
M. A. El Khakani

2004 ◽  
Vol 30 (12) ◽  
pp. 948-955 ◽  
Author(s):  
P. Aleshkevych ◽  
M. Baran ◽  
R. Szymczak ◽  
H. Szymczak ◽  
V. A. Bedarev ◽  
...  

Author(s):  
В.В. Каминский ◽  
С.М. Соловьев ◽  
Г.Д. Хавров ◽  
Н.В. Шаренкова

AbstractThe influence of the Gd content on the semiconductor–metal phase transition in polycrystalline Sm_1– x Gd_ x S thin films produced by the flash evaporation of a powder in vacuum is studied. It is shown that the basic factor of the physical mechanism of the phase transition is compression of the film material. It is established that the films retain their semiconductor properties only up to a Gd content of x = 0.12.


1993 ◽  
Vol 316 ◽  
Author(s):  
J. Z. Wu ◽  
Z. H. Zhang ◽  
V. W. Chen ◽  
N. Yu ◽  
W. K. Chu

ABSTRACTDifferent behaviors of the normal-state resistivity have been observed in (110)-, (113)- and a-oriented YBa2Cu3O7-δ thin films under 200 keV H+ irradiation. It suggests that the c-axis electrical conduction is very sensitive to nonoxygen point defects and a ”semiconductor-metal” phase transition could be induced at very low densities of these defects.


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