scholarly journals Correlation between in situ structural and optical characterization of the semiconductor-to-metal phase transition of VO2 thin films on sapphire

Nanoscale ◽  
2020 ◽  
Vol 12 (2) ◽  
pp. 851-863 ◽  
Author(s):  
Tiziana Cesca ◽  
Carlo Scian ◽  
Emilija Petronijevic ◽  
Grigore Leahu ◽  
Roberto Li Voti ◽  
...  

In situ XRD and IR optical measurements demonstrate the coexistence of M1 and R phases during the SMT transition of VO2 thin films.

2019 ◽  
Vol 10 (4) ◽  
pp. 775-780 ◽  
Author(s):  
D. P. Lelyuk ◽  
A. D. Mishin ◽  
S. S. Maklakov ◽  
A. M. Makarevich ◽  
D. I. Sharovarov

2005 ◽  
Vol 87 (5) ◽  
pp. 051910 ◽  
Author(s):  
D. Brassard ◽  
S. Fourmaux ◽  
M. Jean-Jacques ◽  
J. C. Kieffer ◽  
M. A. El Khakani

2015 ◽  
Vol 107 (10) ◽  
pp. 102105 ◽  
Author(s):  
Jie Jian ◽  
Wenrui Zhang ◽  
Clement Jacob ◽  
Aiping Chen ◽  
Han Wang ◽  
...  

2004 ◽  
Vol 30 (12) ◽  
pp. 948-955 ◽  
Author(s):  
P. Aleshkevych ◽  
M. Baran ◽  
R. Szymczak ◽  
H. Szymczak ◽  
V. A. Bedarev ◽  
...  

Author(s):  
В.В. Каминский ◽  
С.М. Соловьев ◽  
Г.Д. Хавров ◽  
Н.В. Шаренкова

AbstractThe influence of the Gd content on the semiconductor–metal phase transition in polycrystalline Sm_1– x Gd_ x S thin films produced by the flash evaporation of a powder in vacuum is studied. It is shown that the basic factor of the physical mechanism of the phase transition is compression of the film material. It is established that the films retain their semiconductor properties only up to a Gd content of x = 0.12.


RSC Advances ◽  
2016 ◽  
Vol 6 (12) ◽  
pp. 10144-10149 ◽  
Author(s):  
Jia Wang ◽  
Baojia Wu ◽  
Guozhao Zhang ◽  
Lianhua Tian ◽  
Guangrui Gu ◽  
...  

GaAs undergoes a semiconductor–metal transition, which was investigated by in situ electrical measurements and first-principles calculations under a high pressure.


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