Correlation between in situ structural and optical characterization of the semiconductor-to-metal phase transition of VO2 thin films on sapphire
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In situ XRD and IR optical measurements demonstrate the coexistence of M1 and R phases during the SMT transition of VO2 thin films.
2019 ◽
Vol 10
(4)
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pp. 775-780
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2015 ◽
Vol 359
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pp. 819-825
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2006 ◽
Vol 252
(15)
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pp. 5521-5524
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