scholarly journals Long-pulse production of high current negative ion beam by using actively temperature controlled plasma grid for JT-60SA negative ion source

Author(s):  
2008 ◽  
Vol 79 (2) ◽  
pp. 02A519 ◽  
Author(s):  
M. Hanada ◽  
M. Kamada ◽  
N. Akino ◽  
N. Ebisawa ◽  
A. Honda ◽  
...  

1997 ◽  
Vol 68 (5) ◽  
pp. 2012-2019 ◽  
Author(s):  
Y. Takeiri ◽  
M. Osakabe ◽  
Y. Oka ◽  
K. Tsumori ◽  
O. Kaneko ◽  
...  

1996 ◽  
Vol 67 (3) ◽  
pp. 1021-1023 ◽  
Author(s):  
Y. Takeiri ◽  
O. Kaneko ◽  
Y. Oka ◽  
K. Tsumori ◽  
E. Asano ◽  
...  

2020 ◽  
Vol 91 (11) ◽  
pp. 113302
Author(s):  
H. Kaminaga ◽  
T. Takimoto ◽  
A. Tonegawa ◽  
K. N. Sato

2015 ◽  
Vol 55 (6) ◽  
pp. 063006 ◽  
Author(s):  
A. Kojima ◽  
N. Umeda ◽  
M. Hanada ◽  
M. Yoshida ◽  
M. Kashiwagi ◽  
...  

2000 ◽  
Vol 648 ◽  
Author(s):  
X.Q. Cheng ◽  
H.N. Zhu ◽  
B.X. Liu

AbstractFractal pattern evolution of NiSi2 grains on a Si surface was induced by high current pulsed Ni ion implantation into Si wafer using metal vapor vacuum arc ion source. The fractal dimension of the patterns was found to correlate with the temperature rise of the Si substrate caused by the implanting Ni ion beam. With increasing of the substrate temperature, the fractal dimensions were determined to increase from less than 1.64, to beyond the percolation threshold of 1.88, and eventually up to 2.0, corresponding to a uniform layer with fine NiSi2 grains. The growth kinetics of the observed surface fractals was also discussed in terms of a special launching mechanism of the pulsed Ni ion beam into the Si substrate.


1994 ◽  
Vol 65 (4) ◽  
pp. 1269-1271
Author(s):  
Takatoshi Yamashita ◽  
Yutaka Inouchi ◽  
Shuichi Fujiwara ◽  
Yasuhiro Matsuda ◽  
Hiroshi Inami ◽  
...  
Keyword(s):  
Ion Beam ◽  

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