scholarly journals Effect of OFF-state stress induced electric field on trapping in AlGaN/GaN high electron mobility transistors on Si (111)

2015 ◽  
Vol 106 (8) ◽  
pp. 083508 ◽  
Author(s):  
M. J. Anand ◽  
G. I. Ng ◽  
S. Arulkumaran ◽  
C. M. Manoj Kumar ◽  
K. Ranjan ◽  
...  
Keyword(s):  
Electric Field ◽  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Electron Mobility Transistors ◽  
State Stress

Electric Field Driven Degradation of AlGaN/GaN High Electron Mobility Transistors during Off-State Stress

2019 ◽  
Vol 41 (6) ◽  
pp. 89-100
Author(s):  
C. Y. Chang ◽  
Erica Douglas ◽  
Jinhyung Kim ◽  
Lu Liu ◽  
Chien-Fong Lo ◽  
...  
Keyword(s):  
Electric Field ◽  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Electron Mobility Transistors ◽  
State Stress
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