Depth-resolved ultra-violet spectroscopic photo current-voltage measurements for the analysis of AlGaN/GaN high electron mobility transistor epilayer deposited on Si

2014 ◽  
Vol 105 (17) ◽  
pp. 172105 ◽  
Author(s):  
Burcu Ozden ◽  
Chungman Yang ◽  
Fei Tong ◽  
Min P. Khanal ◽  
Vahid Mirkhani ◽  
...  
2019 ◽  
Vol 217 (7) ◽  
pp. 1900694
Author(s):  
Uiho Choi ◽  
Donghyeop Jung ◽  
Kyeongjae Lee ◽  
Taemyung Kwak ◽  
Taehoon Jang ◽  
...  

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