Structure and electronic properties features of amorphous chalhogenide semiconductor films prepared by ion-plasma spraying

Author(s):  
Korobova N. ◽  
Almasov N. ◽  
Prikhodko O. ◽  
Timoshenkov S. ◽  
Tsendin K.
2021 ◽  
Vol 2021 (12) ◽  
pp. 1524-1528
Author(s):  
S. A. Budinovskii ◽  
A. A. Kosmin ◽  
A. S. Benklyan

2019 ◽  
Vol 11 (35) ◽  
pp. 32449-32459 ◽  
Author(s):  
Meng Xu ◽  
Jian-Min Yan ◽  
Lei Guo ◽  
Hui Wang ◽  
Zhi-Xue Xu ◽  
...  

2015 ◽  
Vol 185 ◽  
pp. 497-506 ◽  
Author(s):  
Ken T. Ngo ◽  
Jonathan Rochford ◽  
Hao Fan ◽  
Alberto Batarseh ◽  
Keyur Chitre ◽  
...  

The electronic properties of three porphyrin–bridge–anchor photosensitizers are reported with (1a, 1e, 3a and 3e) or without (2a and 2e) an intramolecular dipole in the bridge. The presence and orientation of the bridge dipole is hypothesized to influence the photovoltaic properties due to variations in the intrinsic dipole at the semiconductor–molecule interface. Electrochemical studies of the porphyrin–bridge–anchor dyes self-assembled on mesoporous nanoparticle ZrO2 films, show that the presence or direction of the bridge dipole does not have an observable effect on the electronic properties of the porphyrin ring. Subsequent photovoltaic measurements of nanostructured TiO2 semiconductor films in dye sensitized solar cells show a reduced photocurrent for photosensitizers 1a and 3a containing a bridge dipole. However, cooperative increased binding of the 1a + 3a co-sensitized device demonstrates that dye packing overrides any differences due to the presence of the small internal dipole.


2010 ◽  
Vol 12 (3,4) ◽  
pp. 279
Author(s):  
O. Prikhodko ◽  
N. Almasov ◽  
N. Korobova ◽  
S. Duysembaev ◽  
K. Turmanova ◽  
...  

<p>The absence of deep traps for electrons in the spectrum of As<sub>40</sub>Se<sub>30</sub>S<sub>30</sub> localized states films obtained by ion sputtering was determined. Bipolar drift of charge carriers was found in amorphous As<sub>40</sub>Se<sub>30</sub>S<sub>30</sub> films of chalcogenide glassy semiconductors, obtained by ion-plasma sputtering of high-frequency, unlike the films of these materials obtained by thermal evaporation.</p>


2013 ◽  
Vol 49 (3) ◽  
pp. 361-367
Author(s):  
Z. A. Duryahina ◽  
V. Ya. Pidkova

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