Direct observation of intrinsic piezoelectricity of Pb(Zr,Ti)O3 by time-resolved x-ray diffraction measurement using single-crystalline films

2014 ◽  
Vol 105 (1) ◽  
pp. 012905 ◽  
Author(s):  
Takashi Fujisawa ◽  
Yoshitaka Ehara ◽  
Shintaro Yasui ◽  
Takafumi Kamo ◽  
Tomoaki Yamada ◽  
...  
Keyword(s):  
Direct Observation ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
Single Crystalline ◽  
X Ray ◽  
Crystalline Films

Time-resolved x-ray diffraction study of laser-induced shock and acoustic waves in single crystalline silicon

2009 ◽  
Vol 106 (4) ◽  
pp. 044914 ◽  
Author(s):  
K.-D. Liss ◽  
T. d’Almeida ◽  
M. Kaiser ◽  
R. Hock ◽  
A. Magerl ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Acoustic Waves ◽  
Crystalline Silicon ◽  
Single Crystalline Silicon ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
Single Crystalline ◽  
X Ray

scholarly journals Large Area Free-Standing Single Crystalline Films of p-Quinquephenyl: Growth, Structure and Photoluminescence Properties

Crystals ◽  
2020 ◽  
Vol 10 (5) ◽  
pp. 363
Author(s):  
Valery A. Postnikov ◽  
Nataliya I. Sorokina ◽  
Maria S. Lyasnikova ◽  
Artem A. Kulishov ◽  
Alexey E. Voloshin ◽  
...  
Keyword(s):  
Photoluminescence Spectra ◽  
Photoluminescence Properties ◽  
X Ray Diffraction ◽  
Large Area ◽  
Free Standing ◽  
Slow Cooling ◽  
Single Crystalline ◽  
X Ray ◽  
Growth Structure ◽  
Crystalline Films

Studies of the growth of large-area free-standing single-crystalline films of p-quinquephenyl are presented. High-quality crystals were grown by slow cooling of a hot chlorobenzene solution. Worse quality large-area free-standing single crystals of p-quinquephenyl were also grown by using physical vapor transport and used for comparison. The crystal structure of p-quinquephenyl at 293 K and 85 K was refined by single-crystal X-ray diffraction. The optical absorption and photoluminescence spectra of solutions and crystalline films were obtained and analyzed; a positive solvatochromic effect was detected.

scholarly journals X-Ray Diffraction Analyses of ZnO and (Zn, Mg)O Single Crystalline Films Epitaxially Grown on a-Plane Sapphire Substrates

2007 ◽  
Vol 56 (3) ◽  
pp. 223-228 ◽  
Author(s):  
Katsuhiko INABA ◽  
Kazuto KOIKE ◽  
Shigehiko SASA ◽  
Masataka INOUE ◽  
Mitsuaki YANO
Keyword(s):  
X Ray Diffraction ◽  
Single Crystalline ◽  
X Ray ◽  
Sapphire Substrates ◽  
Crystalline Films

Time-Resolved X-Ray Diffraction Measurement of Silicon Surface during Laser Irradiation under Grazing-Incidence Conditions

1994 ◽  
Vol 33 (Part 1, No. 10) ◽  
pp. 5612-5616 ◽  
Author(s):  
Shigeru Kojima ◽  
Kuang-Yu Liu ◽  
Yoshihiro Kudo ◽  
Seiji Kawado ◽  
Tetsuya Ishikawa ◽  
...  
Keyword(s):  
Laser Irradiation ◽  
Silicon Surface ◽  
Grazing Incidence ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray
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