scholarly journals Time-resolved grazing-incidence X-ray diffraction measurement to understand the effect of hydrogen on surface strain development in super duplex stainless steel

2020 ◽  
Vol 187 ◽  
pp. 63-67 ◽  
Author(s):  
Cem Örnek ◽  
Alfred Larsson ◽  
Gary S Harlow ◽  
Fan Zhang ◽  
Robin Kroll ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Duplex Stainless Steel ◽  
Grazing Incidence ◽  
Surface Strain ◽  
Diffraction Measurement ◽  
Super Duplex Stainless Steel ◽  
X Ray Diffraction ◽  
Strain Development ◽  
Time Resolved ◽  
X Ray

scholarly journals Problems of Ferrite Content Determination

2020 ◽  
Vol 64 (2) ◽  
pp. 150-158
Author(s):  
Bálint Bögre ◽  
István Mészáros
Keyword(s):  
Stainless Steel ◽  
Duplex Stainless Steel ◽  
Ferrite Content ◽  
Super Duplex Stainless Steel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Content Determination ◽  
Heat Treated ◽  
Δ Ferrite ◽  
Cold Rolled

In this work five different methods – AC magnetometer, DC magnetometer, Feritscope, EBSD and X-ray diffraction - were compared with each other. These methods were used to determine the δ-ferrite content of samples. The limits, disadvantages and advantages of the applied methods were analyzed. The tested material was 2507 type super-duplex stainless steel. The samples were cold rolled and heat treated to modify their ferrite content.

Time-Resolved X-Ray Diffraction Measurement of Silicon Surface during Laser Irradiation under Grazing-Incidence Conditions

1994 ◽  
Vol 33 (Part 1, No. 10) ◽  
pp. 5612-5616 ◽  
Author(s):  
Shigeru Kojima ◽  
Kuang-Yu Liu ◽  
Yoshihiro Kudo ◽  
Seiji Kawado ◽  
Tetsuya Ishikawa ◽  
...  
Keyword(s):  
Laser Irradiation ◽  
Silicon Surface ◽  
Grazing Incidence ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray

In Situ X-Ray Diffraction Study of Load Partitioning and Microyielding for the Super Duplex Stainless Steel SAF2507 (UNS S32750)

2006 ◽  
Vol 524-525 ◽  
pp. 847-852 ◽  
Author(s):  
Ru Lin Peng ◽  
J. Gibmeier ◽  
Sebastian Eulert ◽  
Sten Johansson ◽  
Guo Cai Chai
Keyword(s):  
Stainless Steel ◽  
Duplex Stainless Steel ◽  
Deformation Behaviour ◽  
Uniaxial Tensile ◽  
Super Duplex Stainless Steel ◽  
X Ray Diffraction ◽  
Austenitic Phase ◽  
X Ray ◽  
Applied Stresses

The deformation behaviour of the super duplex stainless steel SAF2507 (UNS S32750) under successive uniaxial tensile loading-unloading was investigated with respect to load sharing and inter-phase interactions. The steel consists of 58% austenite and 42% ferrite in volume. By insitu X-ray diffraction experiment the evolution of phase-specific stresses with applied load was monitored for three successive loading-unloading cycles with the maximum total strains being 0.34%, 0.75% and 1.63%, respectively. It was found that yielding occurred earlier in the austenitic phase than in the ferritic phase during the first loading cycle. In the followed loading cycles, both phases yielded under larger but similar applied stresses. Due to a similar behavior of the phases in the elasto-plastic regime inter-phase interactions were relatively weak. Low microstresses induced by the plastic straining resulted in somewhat larger stresses in the ferritic phase.

Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

2011 ◽  
Vol 44 (5) ◽  
pp. 983-990 ◽  
Author(s):  
Chris Elschner ◽  
Alexandr A. Levin ◽  
Lutz Wilde ◽  
Jörg Grenzer ◽  
Christian Schroer ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Information ◽  
Grazing Incidence ◽  
Test Material ◽  
C60 Fullerene ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Molecular Arrangement ◽  
Diffraction Patterns

The electrical and optical properties of molecular thin films are widely used, for instance in organic electronics, and depend strongly on the molecular arrangement of the organic layers. It is shown here how atomic structural information can be obtained from molecular films without further knowledge of the single-crystal structure. C60 fullerene was chosen as a representative test material. A 250 nm C60 film was investigated by grazing-incidence X-ray diffraction and the data compared with a Bragg–Brentano X-ray diffraction measurement of the corresponding C60 powder. The diffraction patterns of both powder and film were used to calculate the pair distribution function (PDF), which allowed an investigation of the short-range order of the structures. With the help of the PDF, a structure model for the C60 molecular arrangement was determined for both C60 powder and thin film. The results agree very well with a classical whole-pattern fitting approach for the C60 diffraction patterns.

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