Thickness dependent metal-insulator transition and dimensional crossover for weak localization in Si0.02Zn0.98O thin films grown by pulsed laser deposition

2014 ◽  
Vol 115 (19) ◽  
pp. 193705 ◽  
Author(s):  
Amit K. Das ◽  
R. S. Ajimsha ◽  
L. M. Kukreja
2020 ◽  
Vol 177 ◽  
pp. 32-37 ◽  
Author(s):  
Thameur Hajlaoui ◽  
Nicolas Émond ◽  
Christian Quirouette ◽  
Boris Le Drogoff ◽  
Joëlle Margot ◽  
...  

2011 ◽  
Vol 84 (5-6) ◽  
pp. 501-508 ◽  
Author(s):  
Bruno Berini ◽  
Maxime Evain ◽  
Arnaud Fouchet ◽  
Yves Dumont ◽  
Elena Popova ◽  
...  

RSC Advances ◽  
2014 ◽  
Vol 4 (98) ◽  
pp. 55082-55086 ◽  
Author(s):  
Haoliang Huang ◽  
Zhenlin Luo ◽  
Yuanjun Yang ◽  
Mengmeng Yang ◽  
Haibo Wang ◽  
...  

Ultrathin Sm0.6Nd0.4NiO3−δepitaxial films were deposited by pulsed laser deposition (PLD) onto LaAlO3(LAO) single crystal substrates. TheTMIof the SNNO films remarkably decreases with the decrease of the growth oxygen pressure, while the strain state varied slightly.


2015 ◽  
Vol 118 (12) ◽  
pp. 125308 ◽  
Author(s):  
Armando Rúa ◽  
Ramón D. Díaz ◽  
Sergiy Lysenko ◽  
Félix E. Fernández

2013 ◽  
Vol 113 (4) ◽  
pp. 043707 ◽  
Author(s):  
Deyi Fu ◽  
Kai Liu ◽  
Tao Tao ◽  
Kelvin Lo ◽  
Chun Cheng ◽  
...  

2019 ◽  
Vol 1 (6) ◽  
pp. 2303-2310 ◽  
Author(s):  
Liang Yang ◽  
Zhenhua Wang ◽  
Mingze Li ◽  
Xuan P. A. Gao ◽  
Zhidong Zhang

Topological insulator bismuth selenide (Bi2Se3) thin films with a thickness of 6.0 quintuple layers (QL) to 23 QL are deposited using pulsed laser deposition (PLD).


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