Domain switching of fatigued ferroelectric thin films

2014 ◽  
Vol 104 (19) ◽  
pp. 192902 ◽  
Author(s):  
Yun Tak Lim ◽  
Jong Yeog Son ◽  
Young-Han Shin
Keyword(s):  
Thin Films ◽  
Domain Switching ◽  
Ferroelectric Thin Films

scholarly journals Domain switching and spatial dependence of permittivity in ferroelectric thin films

1997 ◽  
Vol 82 (5) ◽  
pp. 2505-2516 ◽  
Author(s):  
Francis K. Chai ◽  
J. R. Brews ◽  
R. D. Schrimpf ◽  
D. P. Birnie
Keyword(s):  
Thin Films ◽  
Spatial Dependence ◽  
Domain Switching ◽  
Ferroelectric Thin Films

Temperature dependence of ferroelectricity and domain switching behavior in Pb(Zr0·3Ti0.7)O3 ferroelectric thin films

2019 ◽  
Vol 45 (14) ◽  
pp. 18030-18036 ◽  
Author(s):  
Xi Chen ◽  
Xiaojun Qiao ◽  
Liaoyuan Zhang ◽  
Jing Zhang ◽  
Qicheng Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Temperature Dependence ◽  
Domain Switching ◽  
Ferroelectric Thin Films ◽  
Switching Behavior

Phase field study on the effect of substrate elasticity on tip-force-induced domain switching in ferroelectric thin films

2021 ◽  
Vol 129 (24) ◽  
pp. 244105
Author(s):  
Jingyuan Li ◽  
Weiming Xiong ◽  
Xiang Huang ◽  
Weijin Chen ◽  
Yue Zheng
Keyword(s):  
Thin Films ◽  
Field Study ◽  
Phase Field ◽  
Domain Switching ◽  
Ferroelectric Thin Films ◽  
Substrate Elasticity

scholarly journals Domain Switching Kinetics in Disordered Ferroelectric Thin Films

2007 ◽  
Vol 99 (26) ◽  
Author(s):  
J. Y. Jo ◽  
H. S. Han ◽  
J.-G. Yoon ◽  
T. K. Song ◽  
S.-H. Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Domain Switching ◽  
Ferroelectric Thin Films

Domain Switching of Ferroelectric Thin Films by Using a Scanning Probe Microscope

2007 ◽  
Vol 51 (92) ◽  
pp. 655 ◽  
Author(s):  
J. Y. Son ◽  
Seongsik Min ◽  
C. H. Kim ◽  
Bog G. Kim ◽  
J. H. Cho
Keyword(s):  
Thin Films ◽  
Domain Switching ◽  
Scanning Probe Microscope ◽  
Ferroelectric Thin Films ◽  
Scanning Probe ◽  
Probe Microscope

scholarly journals Nanoscale Investigation of Polarization Retention Loss in Ferroelectric Thin Films VIA Scanning Force Microscopy

1997 ◽  
Vol 493 ◽  
Author(s):  
A. Gruverman ◽  
S. A. Prakash ◽  
S. Aggarwal ◽  
R. Ramesh ◽  
O. Auciello ◽  
...  
Keyword(s):  
Thin Films ◽  
Domain Switching ◽  
Scanning Force Microscopy ◽  
Ferroelectric Thin Films ◽  
Time Intervals ◽  
Force Microscopy ◽  
Retention Loss ◽  
Scanning Force ◽  
Local Polarization ◽  
Polarization Retention

ABSTRACTScanning force microscopy (SFM) was applied to direct nanoscale investigation of the mechanism of retention loss in ferroelectric thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at various time intervals. A conductive SFM tip was used for domain switching and imaging in the SFM piezoresponse mode.

The creep process of the domain switching in poly(vinylidene fluoride-trifluoroethylene) ferroelectric thin films

2013 ◽  
Vol 103 (4) ◽  
pp. 042909 ◽  
Author(s):  
B. B. Tian ◽  
Z. H. Chen ◽  
A. Q. Jiang ◽  
X. L. Zhao ◽  
B. L. Liu ◽  
...  
Keyword(s):  
Thin Films ◽  
Vinylidene Fluoride ◽  
Domain Switching ◽  
Ferroelectric Thin Films ◽  
Creep Process ◽  
Poly Vinylidene Fluoride
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