scholarly journals Nanoscale Investigation of Polarization Retention Loss in Ferroelectric Thin Films VIA Scanning Force Microscopy

1997 ◽  
Vol 493 ◽  
Author(s):  
A. Gruverman ◽  
S. A. Prakash ◽  
S. Aggarwal ◽  
R. Ramesh ◽  
O. Auciello ◽  
...  
Keyword(s):  
Thin Films ◽  
Domain Switching ◽  
Scanning Force Microscopy ◽  
Ferroelectric Thin Films ◽  
Time Intervals ◽  
Force Microscopy ◽  
Retention Loss ◽  
Scanning Force ◽  
Local Polarization ◽  
Polarization Retention

ABSTRACTScanning force microscopy (SFM) was applied to direct nanoscale investigation of the mechanism of retention loss in ferroelectric thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at various time intervals. A conductive SFM tip was used for domain switching and imaging in the SFM piezoresponse mode.

Nanoscale Properties of SrBi2Ta2O9 Thin Films

2000 ◽  
Vol 655 ◽  
Author(s):  
A. Gruverman ◽  
C. Isobe ◽  
M. Tanaka
Keyword(s):  
Thin Films ◽  
Conduction Mechanism ◽  
Dielectric Breakdown ◽  
Scanning Force Microscopy ◽  
Time Intervals ◽  
Force Microscopy ◽  
Retention Loss ◽  
Scanning Force ◽  
Local Polarization ◽  
First Time

AbstractPiezoresponse scanning force microscopy (PFM) was applied to study the nanoscale mechanism of retention loss in SrBi2Ta2O9 (SBT) thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at different time intervals. The retention behavior of the films was studied as a function of switching conditions and electrode material. SFM was also used for nanoscale mapping of leakage current sites and investigation of electrical conduction mechanism at these sites. For the first time, the development of dielectric breakdown in SBT films was directly observed at nanoscale.

Nonlinear local piezoelectric deformation in ferroelectric thin films studied by scanning force microscopy

2005 ◽  
Vol 97 (10) ◽  
pp. 104105 ◽  
Author(s):  
V. V. Shvartsman ◽  
N. A. Pertsev ◽  
J. M. Herrero ◽  
C. Zaldo ◽  
A. L. Kholkin
Keyword(s):  
Thin Films ◽  
Scanning Force Microscopy ◽  
Ferroelectric Thin Films ◽  
Force Microscopy ◽  
Scanning Force
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