Electrical and optical characterization of Pd/ZnO nanorods (NRs) Schottky diodes grown on n-Si substrates

2014 ◽  
Author(s):  
Divya Somvanshi ◽  
S. Jit
Keyword(s):  
Schottky Diodes ◽  
Zno Nanorods ◽  
Optical Characterization ◽  
Si Substrates

Optical characterization of stress in narrow GaAs stripes on patterned Si substrates

1989 ◽  
Vol 55 (4) ◽  
pp. 365-367 ◽  
Author(s):  
J. De Boeck ◽  
K. Deneffe ◽  
J. Christen ◽  
D. J. Arent ◽  
G. Borghs
Keyword(s):  
Optical Characterization ◽  
Si Substrates

scholarly journals Surface passivation and optical characterization of Al2O3/a-SiCx stacks on c-Si substrates

2013 ◽  
Vol 4 ◽  
pp. 726-731 ◽  
Author(s):  
Gema López ◽  
Pablo R Ortega ◽  
Cristóbal Voz ◽  
Isidro Martín ◽  
Mónica Colina ◽  
...  
Keyword(s):  
Wavelength Range ◽  
Surface Passivation ◽  
Crystalline Silicon ◽  
Surface Recombination ◽  
Chemical Vapor ◽  
Optical Characterization ◽  
Surface Recombination Velocity ◽  
Carrier Injection ◽  
Si Substrates

The aim of this work is to study the surface passivation of aluminum oxide/amorphous silicon carbide (Al2O3/a-SiCx) stacks on both p-type and n-type crystalline silicon (c-Si) substrates as well as the optical characterization of these stacks. Al2O3 films of different thicknesses were deposited by thermal atomic layer deposition (ALD) at 200 °C and were complemented with a layer of a-SiCx deposited by plasma-enhanced chemical vapor deposition (PECVD) to form anti-reflection coating (ARC) stacks with a total thickness of 75 nm. A comparative study has been carried out on polished and randomly textured wafers. We have experimentally determined the optimum thickness of the stack for photovoltaic applications by minimizing the reflection losses over a wide wavelength range (300–1200 nm) without compromising the outstanding passivation properties of the Al2O3 films. The upper limit of the surface recombination velocity (S eff,max) was evaluated at a carrier injection level corresponding to 1-sun illumination, which led to values below 10 cm/s. Reflectance values below 2% were measured on textured samples over the wavelength range of 450–1000 nm.

Electro-optical characterization of Ti/Au–ZnTe Schottky diodes with CdTe quantum dots

2012 ◽  
Vol 134 (2-3) ◽  
pp. 821-828 ◽  
Author(s):  
E. Zielony ◽  
E. Płaczek-Popko ◽  
P. Nowakowski ◽  
Z. Gumienny ◽  
A. Suchocki ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Schottky Diodes ◽  
Optical Characterization ◽  
Cdte Quantum Dots

scholarly journals Structural and optical characterization of Mg-doped GaAs nanowires grown on GaAs and Si substrates

2013 ◽  
Vol 114 (18) ◽  
pp. 183508 ◽  
Author(s):  
B. P. Falcão ◽  
J. P. Leitão ◽  
M. R. Correia ◽  
M. R. Soares ◽  
F. M. Morales ◽  
...  
Keyword(s):  
Optical Characterization ◽  
Si Substrates ◽  
Gaas Nanowires ◽  
Mg Doped

Structural and optical characterization of hydroxy-propyl methyl cellulose-capped ZnO nanorods

2013 ◽  
Vol 48 (16) ◽  
pp. 5536-5542 ◽  
Author(s):  
H. S. Bhatti ◽  
Sunil Kumar ◽  
Karamjit Singh ◽  
Kavita
Keyword(s):  
Zno Nanorods ◽  
Methyl Cellulose ◽  
Optical Characterization

scholarly journals Optical Characterization of ZnO Nanorods Grown by the Ultra-Fast and Low Temperature Hydrothermal Process

2016 ◽  
Vol 130 (5) ◽  
pp. 1199-1201
Author(s):  
B.S. Witkowski ◽  
V.Y. Ivanov ◽  
Ł. Wachnicki ◽  
S. Gierałtowska ◽  
M. Godlewski
Keyword(s):  
Low Temperature ◽  
Zno Nanorods ◽  
Hydrothermal Process ◽  
Optical Characterization

Electro-Optical Characterization of Self-Assembled InAs/GaAs Quantum Rings Embedded in P-i-N and Schottky Diodes

2007 ◽  
Author(s):  
A. G. Taboada ◽  
F. Suárez ◽  
D. Granados ◽  
T. J. Badcock ◽  
D. J. Mowbray ◽  
...  
Keyword(s):  
Schottky Diodes ◽  
Optical Characterization ◽  
Quantum Rings ◽  
Self Assembled

Characterization of ZnO nanorods grown on Si substrates coated with NiCl2

2010 ◽  
Vol 45 (9) ◽  
pp. 988-992 ◽  
Author(s):  
Jie Wang ◽  
Huizhao Zhuang ◽  
Junlin Li ◽  
Peng Xu
Keyword(s):  
Zno Nanorods ◽  
Si Substrates

Structural, Electromechanical and Optical Characterization of ZnO Nanorods

2011 ◽  
Vol 3 (4) ◽  
pp. 468-471
Author(s):  
Walter Water ◽  
Te-Hua Fang ◽  
Yu-Jen Hsiao ◽  
Liang-Wen Ji ◽  
Ju-Hsuan Tsai ◽  
...  
Keyword(s):  
Zno Nanorods ◽  
Optical Characterization
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