scholarly journals Frequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: The dip-df mode

2014 ◽  
Vol 85 (4) ◽  
pp. 043707 ◽  
Author(s):  
Sebastian Rode ◽  
Martin Schreiber ◽  
Angelika Kühnle ◽  
Philipp Rahe
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Shift ◽  
Force Microscopy ◽  
Atomic Force

Correlation of frequency shift discontinuity to atomic positions on a Si(111)7 × 7 surface by noncontact atomic force microscopy

2000 ◽  
Vol 11 (2) ◽  
pp. 120-123 ◽  
Author(s):  
Seizo Morita ◽  
Yasuhiro Sugawara ◽  
Kousuke Yokoyama ◽  
Takayuki Uchihashi ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Shift ◽  
Force Microscopy ◽  
Atomic Force

Bottom-tracking: the possibilities and physical meaning of keeping the bottom of the frequency shift in atomic force microscopy

2020 ◽  
Vol 59 (SN) ◽  
pp. SN1012
Author(s):  
Denis Damiron ◽  
Pierre E. Allain ◽  
Dai Kobayashi ◽  
Naruo Sasaki ◽  
Hideki Kawakatsu
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Shift ◽  
Physical Meaning ◽  
Force Microscopy ◽  
Atomic Force

Pico-Newton Controlled Step-in Mode NC-AFM Using a Quadrature Frequency Demodulator and a Slim Probe in Air for CD-AFM

2011 ◽  
Vol 497 ◽  
pp. 95-100
Author(s):  
Sumio Hosaka ◽  
Takayuki Takizawa ◽  
Daisuke Terauchi ◽  
You Yin ◽  
Hayato Sone
Keyword(s):  
Atomic Force Microscopy ◽  
Resonant Frequency ◽  
Frequency Shift ◽  
Precise Measurement ◽  
Nanometer Resolution ◽  
Force Microscopy ◽  
Resonant Frequency Shift ◽  
Atomic Force

We have studied a step-in mode non-contact atomic force microscopy (NC-AFM) for precise measurement of fine and steep structure with nanometer resolution in air. When a high aspect structure is measured using step-in mode AFM with the sharpened and slim probe, it is required that AFM control has to be performed at a force of <1 nN in pico-Newton range to suppress the bending and slipping of the probe on slop. Using a home-made step-in mode NC-AFM using a quadrature frequency demodulator for resonant frequency shift of the cantilever, the NC-AFM demonstrated that Si steep structure was faithfully observed at about 2 pN in air.

scholarly journals Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

2012 ◽  
Vol 3 ◽  
pp. 238-248 ◽  
Author(s):  
Joachim Welker ◽  
Esther Illek ◽  
Franz J Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Shift ◽  
Frequency Modulation ◽  
Matrix Method ◽  
Oscillation Amplitude ◽  
Decay Length ◽  
Amplitude Dependence ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Matrix

In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader–Jarvis method) and Giessibl (matrix method) are investigated with respect to the deconvolution quality. Both methods show a nontrivial dependence of the deconvolution quality on the oscillation amplitude. The matrix method exhibits spikelike features originating from a numerical artifact. By interpolation of the data, the spikelike features can be circumvented. The Sader–Jarvis method has a continuous amplitude dependence showing two minima and one maximum, which is an inherent property of the deconvolution algorithm. The optimal deconvolution depends on the ratio of the amplitude and the characteristic decay length of the force for the Sader–Jarvis method. However, the matrix method generally provides the higher deconvolution quality.

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