scholarly journals Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy

2011 ◽  
Vol 82 (3) ◽  
pp. 033702 ◽  
Author(s):  
Kei Kobayashi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Shift ◽  
Frequency Modulation ◽  
Phase Shifting ◽  
Frequency Noise ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

2012 ◽  
Vol 3 ◽  
pp. 238-248 ◽  
Author(s):  
Joachim Welker ◽  
Esther Illek ◽  
Franz J Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Shift ◽  
Frequency Modulation ◽  
Matrix Method ◽  
Oscillation Amplitude ◽  
Decay Length ◽  
Amplitude Dependence ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Matrix

In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader–Jarvis method) and Giessibl (matrix method) are investigated with respect to the deconvolution quality. Both methods show a nontrivial dependence of the deconvolution quality on the oscillation amplitude. The matrix method exhibits spikelike features originating from a numerical artifact. By interpolation of the data, the spikelike features can be circumvented. The Sader–Jarvis method has a continuous amplitude dependence showing two minima and one maximum, which is an inherent property of the deconvolution algorithm. The optimal deconvolution depends on the ratio of the amplitude and the characteristic decay length of the force for the Sader–Jarvis method. However, the matrix method generally provides the higher deconvolution quality.

Frequency noise in frequency modulation atomic force microscopy

2009 ◽  
Vol 80 (4) ◽  
pp. 043708 ◽  
Author(s):  
Kei Kobayashi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Frequency Noise ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Frequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: The dip-df mode

2014 ◽  
Vol 85 (4) ◽  
pp. 043707 ◽  
Author(s):  
Sebastian Rode ◽  
Martin Schreiber ◽  
Angelika Kühnle ◽  
Philipp Rahe
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Shift ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Resolving Structure and Mechanical Properties at the Nanoscale of Viruses with Frequency Modulation Atomic Force Microscopy

PLoS ONE ◽  
2012 ◽  
Vol 7 (1) ◽  
pp. e30204 ◽  
Author(s):  
David Martinez-Martin ◽  
Carolina Carrasco ◽  
Mercedes Hernando-Perez ◽  
Pedro J. de Pablo ◽  
Julio Gomez-Herrero ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force

Mapping and imaging for rapid atom discrimination: A study of frequency modulation atomic force microscopy

2009 ◽  
Vol 94 (2) ◽  
pp. 023108 ◽  
Author(s):  
Yoshiaki Sugimoto ◽  
Takashi Namikawa ◽  
Masayuki Abe ◽  
Seizo Morita
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force

Self-assembled monolayers of sulfonate-terminated alkanethiols investigated by frequency modulation atomic force microscopy in liquid

2017 ◽  
Vol 28 (45) ◽  
pp. 455603 ◽  
Author(s):  
Hitoshi Asakawa ◽  
Natsumi Inada ◽  
Kaito Hirata ◽  
Sayaka Matsui ◽  
Takumi Igarashi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled

High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method

2010 ◽  
Vol 3 (6) ◽  
pp. 065205 ◽  
Author(s):  
Ken-ichi Umeda ◽  
Noriaki Oyabu ◽  
Kei Kobayashi ◽  
Yoshiki Hirata ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Excitation Method
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