Quantity measured in frequency-shift-mode atomic-force microscopy: An analysis with a numerical model

1999 ◽  
Vol 59 (20) ◽  
pp. 13267-13272 ◽  
Author(s):  
S. H. Ke ◽  
T. Uda ◽  
K. Terakura
Keyword(s):  
Atomic Force Microscopy ◽  
Numerical Model ◽  
Frequency Shift ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

scholarly journals Frequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: The dip-df mode

2014 ◽  
Vol 85 (4) ◽  
pp. 043707 ◽  
Author(s):  
Sebastian Rode ◽  
Martin Schreiber ◽  
Angelika Kühnle ◽  
Philipp Rahe
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Shift ◽  
Force Microscopy ◽  
Atomic Force

Tapping Mode Atomic Force Microscopy Studies of the Photoreduction of Ag+on Individual Submicrometer TiO2Particles

Langmuir ◽  
1999 ◽  
Vol 15 (25) ◽  
pp. 8569-8573 ◽  
Author(s):  
William E. Farneth ◽  
R. Scott McLean ◽  
John D. Bolt ◽  
Eleni Dokou ◽  
Mark A. Barteau
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Mapping of electrical double-layer force between tip and sample surfaces in water with pulsed-force-mode atomic force microscopy

1997 ◽  
Vol 71 (18) ◽  
pp. 2632-2634 ◽  
Author(s):  
Tatsuya Miyatani ◽  
Miki Horii ◽  
Armin Rosa ◽  
Masamichi Fujihira ◽  
Othmar Marti
Keyword(s):  
Atomic Force Microscopy ◽  
Double Layer ◽  
Electrical Double Layer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Mode ◽  
Mode Atomic Force Microscopy

Torsional resonance mode atomic force microscopy in liquid with Lorentz force actuation

2013 ◽  
Vol 24 (30) ◽  
pp. 305702 ◽  
Author(s):  
Chih-Wen Yang ◽  
Ren-Feng Ding ◽  
Shih-Hsiu Lai ◽  
Hsien-Shun Liao ◽  
Wei-Chiao Lai ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Lorentz Force ◽  
Resonance Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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