A novel method for the determination of the full energetic distribution of interface state density in metal/insulator/GaN structures from capacitance - voltage and photocapacitance - light intensity measurements

Mapping Intimacies ◽

10.1063/1.4848283 ◽

2013 ◽

Author(s):

Maciej Matys ◽

Boguslawa Adamowicz ◽

Tamotsu Hashizume

Keyword(s):

Light Intensity ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Metal Insulator ◽

Intensity Measurements ◽

Capacitance Voltage ◽

Novel Method

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Determination of the deep donor-like interface state density distribution in metal/Al2O3/n-GaN structures from the photocapacitance–light intensity measurement

Applied Physics Letters ◽

10.1063/1.4769815 ◽

2012 ◽

Vol 101 (23) ◽

pp. 231608 ◽

Cited By ~ 18

Author(s):

M. Matys ◽

B. Adamowicz ◽

T. Hashizume

Keyword(s):

Light Intensity ◽

Density Distribution ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Intensity Measurement ◽

Deep Donor

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Sources of errors in quasistatic capacitance-voltage determination of the interface state density distribution in the MOS system

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/10/1/010 ◽

1977 ◽

Vol 10 (1) ◽

pp. 83-95 ◽

Cited By ~ 6

Author(s):

Y T Yeow ◽

M R Boudry ◽

D R Lamb ◽

S D Brotherton

Keyword(s):

Density Distribution ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Capacitance Voltage

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Determination of interface state density in MOSFETs using the spatial profiling charge pumping technique

Solid-State Electronics ◽

10.1016/0038-1101(92)90005-w ◽

1992 ◽

Vol 35 (8) ◽

pp. 1059-1063 ◽

Cited By ~ 26

Author(s):

X.M. Li ◽

M.J. Deen

Keyword(s):

Interface State ◽

State Density ◽

Interface State Density ◽

Charge Pumping ◽

Spatial Profiling

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Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements

Semiconductor Physics Quantum Electronics & Optoelectronics ◽

10.15407/spqeo15.01.001 ◽

2012 ◽

Vol 15 (1) ◽

pp. 1-7 ◽

Cited By ~ 5

Author(s):

Yu. V. Gomeniuk ◽

Keyword(s):

Interface State ◽

State Density ◽

Interface State Density ◽

Frequency Measurements ◽

High K ◽

Silicon System ◽

High K Dielectric

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Effect of photochemical etching on interface state density of Ga0.47In0.53As metal/insulator/semiconductor diodes

Electronics Letters ◽

10.1049/el:19870630 ◽

1987 ◽

Vol 23 (17) ◽

pp. 891 ◽

Cited By ~ 1

Author(s):

A. Aoki ◽

S. Miyoshi ◽

J. Shirafuji

Keyword(s):

Interface State ◽

State Density ◽

Interface State Density ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Photochemical Etching

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Determination of interface state density in small-geometry MOSFETs by high-low-frequency transconductance method

IEEE Electron Device Letters ◽

10.1109/55.75682 ◽

1991 ◽

Vol 12 (1) ◽

pp. 13-15 ◽

Cited By ~ 14

Author(s):

H.-S. Chen ◽

S.S. Li

Keyword(s):

Low Frequency ◽

Interface State ◽

State Density ◽

Interface State Density

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Effects of interface state density on the carrier transport and performance of metal-insulator-semiconductor (MIS) type thin film solar cells

Journal of Physics Conference Series ◽

10.1088/1742-6596/1481/1/012005 ◽

2020 ◽

Vol 1481 ◽

pp. 012005

Author(s):

Fandi Oktasendra ◽

Rahmat Hidayat ◽

Rizky Indra Utama

Keyword(s):

Thin Film ◽

Solar Cells ◽

Carrier Transport ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Thin Film Solar Cells ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

And Performance

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Electrical properties and the determination of interface state density from I–V, C–f and G–f measurements in Ir/Ru/n-InGaN Schottky barrier diode

Semiconductors ◽

10.1134/s1063782617120156 ◽

2017 ◽

Vol 51 (12) ◽

pp. 1641-1649 ◽

Cited By ~ 1

Author(s):

R. Padma ◽

V. Rajagopal Reddy

Keyword(s):

Electrical Properties ◽

Schottky Barrier ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Schottky Barrier Diode

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Determination of interface state density on Au/Ta2O5/n-InP structures by different methods

Materials Science and Engineering B ◽

10.1016/0921-5107(94)90096-5 ◽

1994 ◽

Vol 28 (1-3) ◽

pp. 416-420 ◽

Cited By ~ 2

Author(s):

K. Boulkroun ◽

Z. Ouennoughi ◽

A. Bouziane ◽

J. Bougdira ◽

M. Elbouabdellati ◽

...

Keyword(s):

Interface State ◽

State Density ◽

Interface State Density

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On the determination of interface state density in n-InP Schottky structures by current–voltage measurements

Solid-State Electronics ◽

10.1016/s0038-1101(99)00269-5 ◽

2000 ◽

Vol 44 (3) ◽

pp. 515-520 ◽

Cited By ~ 23

Author(s):

A Ahaitouf ◽

E Losson ◽

A Bath

Keyword(s):

Interface State ◽

State Density ◽

Interface State Density ◽

Current Voltage

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