Determination of the deep donor-like interface state density distribution in metal/Al2O3/n-GaN structures from the photocapacitance–light intensity measurement

M. Matys; B. Adamowicz; T. Hashizume

doi:10.1063/1.4769815

Determination of the deep donor-like interface state density distribution in metal/Al2O3/n-GaN structures from the photocapacitance–light intensity measurement

Applied Physics Letters ◽

10.1063/1.4769815 ◽

2012 ◽

Vol 101 (23) ◽

pp. 231608 ◽

Cited By ~ 18

Author(s):

M. Matys ◽

B. Adamowicz ◽

T. Hashizume

Keyword(s):

Light Intensity ◽

Density Distribution ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Intensity Measurement ◽

Deep Donor

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A novel method for the determination of the full energetic distribution of interface state density in metal/insulator/GaN structures from capacitance - voltage and photocapacitance - light intensity measurements

10.1063/1.4848283 ◽

2013 ◽

Author(s):

Maciej Matys ◽

Boguslawa Adamowicz ◽

Tamotsu Hashizume

Keyword(s):

Light Intensity ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Metal Insulator ◽

Intensity Measurements ◽

Capacitance Voltage ◽

Novel Method

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Determination of Interface State Density Distribution and Surface Recombination Velocity on Passivated Semiconductor Surfaces by Photoluminescence Surface State Spectroscopy

Materials Science Forum ◽

10.4028/www.scientific.net/msf.185-188.53 ◽

1995 ◽

Vol 185-188 ◽

pp. 53-58

Author(s):

T. Saitoh ◽

Hisashi Hasegawa

Keyword(s):

Density Distribution ◽

Surface State ◽

Surface Recombination ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Surface Recombination Velocity ◽

Semiconductor Surfaces ◽

Recombination Velocity

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A facile growth of spray based ZnO films and device performance investigation for Schottky diodes: Determination of interface state density distribution

Journal of Alloys and Compounds ◽

10.1016/j.jallcom.2017.02.198 ◽

2017 ◽

Vol 708 ◽

pp. 55-66 ◽

Cited By ~ 27

Author(s):

Şakir Aydoğan ◽

Maria Luisa Grilli ◽

Mehmet Yilmaz ◽

Zakir Çaldiran ◽

Hatice Kaçuş

Keyword(s):

Density Distribution ◽

Schottky Diodes ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Zno Films ◽

Device Performance

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The determination of the interface-state density distribution from the capacitance-frequency measurements in Au/n-Si schottky barrier diodes

Journal of Electronic Materials ◽

10.1007/s11664-002-0157-9 ◽

2002 ◽

Vol 31 (2) ◽

pp. 119-123 ◽

Cited By ~ 45

Author(s):

E. Ayyildiz ◽

Ç. Nuho Lu ◽

A Türüt

Keyword(s):

Density Distribution ◽

Schottky Barrier ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Schottky Barrier Diodes ◽

Frequency Measurements

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Sources of errors in quasistatic capacitance-voltage determination of the interface state density distribution in the MOS system

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/10/1/010 ◽

1977 ◽

Vol 10 (1) ◽

pp. 83-95 ◽

Cited By ~ 6

Author(s):

Y T Yeow ◽

M R Boudry ◽

D R Lamb ◽

S D Brotherton

Keyword(s):

Density Distribution ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Capacitance Voltage

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Influence of Lateral Charge Inhomogeneities in MOS Structures on the Determination of the Interface State Density Distribution from HF CV Curves

phys stat sol (a) ◽

10.1002/pssa.2210790212 ◽

1983 ◽

Vol 79 (2) ◽

pp. 417-421 ◽

Cited By ~ 4

Author(s):

F. Fenske

Keyword(s):

Density Distribution ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Mos Structures

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The determination of the interface state density distribution of the Al/methyl red/p-Si Schottky barrier diode by using a capacitance method

Physica B Condensed Matter ◽

10.1016/j.physb.2006.06.126 ◽

2007 ◽

Vol 388 (1-2) ◽

pp. 244-248 ◽

Cited By ~ 61

Author(s):

T. Kılıçoğlu ◽

M.E. Aydın ◽

Y.S. Ocak

Keyword(s):

Density Distribution ◽

Schottky Barrier ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Schottky Barrier Diode ◽

Methyl Red ◽

Capacitance Method

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Determination of interface state density in MOSFETs using the spatial profiling charge pumping technique

Solid-State Electronics ◽

10.1016/0038-1101(92)90005-w ◽

1992 ◽

Vol 35 (8) ◽

pp. 1059-1063 ◽

Cited By ~ 26

Author(s):

X.M. Li ◽

M.J. Deen

Keyword(s):

Interface State ◽

State Density ◽

Interface State Density ◽

Charge Pumping ◽

Spatial Profiling

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Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements

Semiconductor Physics Quantum Electronics & Optoelectronics ◽

10.15407/spqeo15.01.001 ◽

2012 ◽

Vol 15 (1) ◽

pp. 1-7 ◽

Cited By ~ 5

Author(s):

Yu. V. Gomeniuk ◽

Keyword(s):

Interface State ◽

State Density ◽

Interface State Density ◽

Frequency Measurements ◽

High K ◽

Silicon System ◽

High K Dielectric

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Temperature dependence of interface state density distribution determined from conductance–frequency measurements in Ni/n-GaP/Al diode

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-020-04638-3 ◽

2020 ◽

Vol 31 (23) ◽

pp. 21260-21271

Author(s):

S. Duman ◽

K. Ejderha ◽

I. Orak ◽

N. Yıldırım ◽

A. Turut

Keyword(s):

Density Distribution ◽

Temperature Dependence ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Frequency Measurements

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