Electronic structure, morphology and emission polarization of enhanced symmetry InAs quantum-dot-like structures grown on InP substrates by molecular beam epitaxy

2013 ◽  
Vol 114 (9) ◽  
pp. 094306 ◽  
Author(s):  
A. Maryński ◽  
G. Sęk ◽  
A. Musiał ◽  
J. Andrzejewski ◽  
J. Misiewicz ◽  
...  
2012 ◽  
Vol 9 (7) ◽  
pp. 1534-1536 ◽  
Author(s):  
Ong-arj Tangmettajittakul ◽  
Supachok Thainoi ◽  
Somsak Panyakeow ◽  
Somchai Ratanathammaphan

2008 ◽  
Author(s):  
P. J. Carrington ◽  
V. A. Solov'ev ◽  
Q. Zhuang ◽  
S. V. Ivanov ◽  
A. Krier

Author(s):  
П.В. Середин ◽  
А.С. Леньшин ◽  
Д.С. Золотухин ◽  
Д.Л. Голощапов ◽  
А.М. Мизеров ◽  
...  

This paper reports on influence of the nanoporous Si buffer layer on morphological, physical and structural properties of the InxGa1-xN layer with nanocolumnar morphology of the surface, grown by plasma assisted molecular beam epitaxy on the traditional Si(111) substrates. By means of various structural and spectroscopy methods electronic structure, morphology of the surface and optical properties of grown heterostructures was studied. We showed that usage of por-Si ad-layer helps to achieve more isotropic InGaN nanocolumns diameter distribution as well as to increase PL intensity up to 25%.


2013 ◽  
Vol 103 (6) ◽  
pp. 061114 ◽  
Author(s):  
X. Liu ◽  
K. Akahane ◽  
N. A. Jahan ◽  
N. Kobayashi ◽  
M. Sasaki ◽  
...  

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