Note: Portable total reflection X-ray fluorescence spectrometer with small vacuum chamber

2013 ◽  
Vol 84 (4) ◽  
pp. 046108 ◽  
Author(s):  
Shinsuke Kunimura ◽  
Shunpei Kudo ◽  
Hiroki Nagai ◽  
Yoshihide Nakajima ◽  
Hitoshi Ohmori
Keyword(s):  
Vacuum Chamber ◽  
Total Reflection ◽  
X Ray ◽  
Fluorescence Spectrometer

Low-power total reflection X-ray fluorescence spectrometer using diffractometer guide rail

2014 ◽  
Vol 30 (1) ◽  
pp. 36-39
Author(s):  
Ying Liu ◽  
Susumu Imashuku ◽  
Jun Kawai
Keyword(s):  
Detection Limit ◽  
Low Power ◽  
Power Supply ◽  
Total Reflection ◽  
Minimum Detection Limit ◽  
Guide Rail ◽  
X Ray ◽  
Fluorescence Spectrometer

An X-ray diffractometer (XRD) was modified to a low-power total reflection X-ray fluorescence (TXRF) spectrometer. This was realized by reducing the XRD tube power (3 kW) down to 10 W by a Spellman power supply. The present spectrometer consisted of a waveguide slit, Si-PIN detector, a goniometer and two Z-axis stages that were set on a diffractometer guide rail. This unit was easy in assembly. The first measurements with this spectrometer were presented. The minimum detection limit for Cr was estimated to be a few nanograms or at the level of 1013 atoms cm−2.

Determinations of low atomic number elements in real uranium oxide samples using vacuum chamber total reflection X-ray fluorescence

2015 ◽  
Vol 44 (6) ◽  
pp. 475-475
Author(s):  
Sangita Dhara ◽  
N. L. Misra ◽  
S. K. Aggarwal ◽  
Dieter Ingerle ◽  
Peter Wobrauschek ◽  
...  
Keyword(s):  
Atomic Number ◽  
Uranium Oxide ◽  
Vacuum Chamber ◽  
Total Reflection ◽  
X Ray

A portable micro-X-ray fluorescence spectrometer with polycapillary optics and vacuum chamber for archaeometric and other applications

2007 ◽  
Vol 62 (11) ◽  
pp. 1252-1256 ◽  
Author(s):  
G. Buzanich ◽  
P. Wobrauschek ◽  
C. Streli ◽  
A. Markowicz ◽  
D. Wegrzynek ◽  
...  
Keyword(s):  
Vacuum Chamber ◽  
Polycapillary Optics ◽  
X Ray ◽  
Fluorescence Spectrometer
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