Determinations of low atomic number elements in real uranium oxide samples using vacuum chamber total reflection X-ray fluorescence

2015 ◽  
Vol 44 (6) ◽  
pp. 475-475
Author(s):  
Sangita Dhara ◽  
N. L. Misra ◽  
S. K. Aggarwal ◽  
Dieter Ingerle ◽  
Peter Wobrauschek ◽  
...  
Keyword(s):  
Atomic Number ◽  
Uranium Oxide ◽  
Vacuum Chamber ◽  
Total Reflection ◽  
X Ray

Determinations of low atomic number elements in real uranium oxide samples using vacuum chamber total reflection x-ray fluorescence

2013 ◽  
Vol 43 (2) ◽  
pp. 108-111 ◽  
Author(s):  
Sangita Dhara ◽  
N.L. Misra ◽  
S.K. Aggarwal ◽  
Dieter Ingerle ◽  
Peter Wobrauschek ◽  
...  
Keyword(s):  
Atomic Number ◽  
Uranium Oxide ◽  
Vacuum Chamber ◽  
Total Reflection ◽  
X Ray

Determination of low atomic number elements at trace levels in uranium matrix using vacuum chamber total reflection X-ray fluorescence

2010 ◽  
Vol 65 (6) ◽  
pp. 457-460 ◽  
Author(s):  
N.L. Misra ◽  
Sangita Dhara ◽  
M. Óvári ◽  
Gy. Záray ◽  
S.K. Aggarwal ◽  
...  
Keyword(s):  
Atomic Number ◽  
Vacuum Chamber ◽  
Total Reflection ◽  
X Ray ◽  
Uranium Matrix

Contribution of x-ray total reflection to the background intensity in EPMA

1990 ◽  
Vol 48 (2) ◽  
pp. 202-203
Author(s):  
Werner P. Rehbach ◽  
Peter Karduck
Keyword(s):  
Atomic Number ◽  
Target Material ◽  
Total Reflection ◽  
Background Intensity ◽  
X Rays ◽  
Characteristic Radiation ◽  
X Ray

In the EPMA of soft x rays anomalies in the background are found for several elements. In the literature extremely high backgrounds in the region of the OKα line are reported for C, Al, Si, Mo, and Zr. We found the same effect also for Boron (Fig. 1). For small glancing angles θ, the background measured using a LdSte crystal is significantly higher for B compared with BN and C, although the latter are of higher atomic number. It would be expected, that , characteristic radiation missing, the background IB (bremsstrahlung) is proportional Zn by variation of the atomic number of the target material. According to Kramers n has the value of unity, whereas Rao-Sahib and Wittry proposed values between 1.12 and 1.38 , depending on Z, E and Eo. In all cases IB should increase with increasing atomic number Z. The measured values are in discrepancy with the expected ones.

Synchrotron Radiation for Measurement of Contaminants on Silicon Surfaces

1993 ◽  
Vol 307 ◽  
Author(s):  
Michael C. Madden ◽  
David C. Wherry ◽  
Piero Pianetta ◽  
Sean Brennan
Keyword(s):  
Detection Limit ◽  
Synchrotron Radiation ◽  
Transition Metals ◽  
Atomic Number ◽  
Incident Radiation ◽  
Total Reflection ◽  
Silicon Surfaces ◽  
Synchrotron Source ◽  
X Ray

ABSTRACTThe detection limit for aluminum using total reflection x-ray fluorescence (TXRF) is approximately 100 times lower for a synchrotron source compared to a conventional source. The detection limit for transition metals is approximately 15 to 40 times lower depending on atomic number and energy of the incident radiation.

Direct determination of fluorine in high-purity water samples using vacuum sample chamber total reflection X-ray fluorescence spectrometry

2018 ◽  
Vol 33 (5) ◽  
pp. 876-882 ◽  
Author(s):  
Kaushik Sanyal ◽  
N. L. Misra
Keyword(s):  
High Purity ◽  
Water Samples ◽  
Vacuum Chamber ◽  
Direct Determination ◽  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
X Ray ◽  
Sample Chamber

Trace levels of F in high-purity water samples were determined using vacuum chamber total reflection X-ray fluorescence spectrometry.

Note: Portable total reflection X-ray fluorescence spectrometer with small vacuum chamber

2013 ◽  
Vol 84 (4) ◽  
pp. 046108 ◽  
Author(s):  
Shinsuke Kunimura ◽  
Shunpei Kudo ◽  
Hiroki Nagai ◽  
Yoshihide Nakajima ◽  
Hitoshi Ohmori
Keyword(s):  
Vacuum Chamber ◽  
Total Reflection ◽  
X Ray ◽  
Fluorescence Spectrometer
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