The determination of the interface state density distribution of the Al/methyl red/p-Si Schottky barrier diode by using a capacitance method

T. Kılıçoğlu; M.E. Aydın; Y.S. Ocak

doi:10.1016/j.physb.2006.06.126

The determination of the interface state density distribution of the Al/methyl red/p-Si Schottky barrier diode by using a capacitance method

Physica B Condensed Matter ◽

10.1016/j.physb.2006.06.126 ◽

2007 ◽

Vol 388 (1-2) ◽

pp. 244-248 ◽

Cited By ~ 61

Author(s):

T. Kılıçoğlu ◽

M.E. Aydın ◽

Y.S. Ocak

Keyword(s):

Density Distribution ◽

Schottky Barrier ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Schottky Barrier Diode ◽

Methyl Red ◽

Capacitance Method

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Electrical properties and the determination of interface state density from I–V, C–f and G–f measurements in Ir/Ru/n-InGaN Schottky barrier diode

Semiconductors ◽

10.1134/s1063782617120156 ◽

2017 ◽

Vol 51 (12) ◽

pp. 1641-1649 ◽

Cited By ~ 1

Author(s):

R. Padma ◽

V. Rajagopal Reddy

Keyword(s):

Electrical Properties ◽

Schottky Barrier ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Schottky Barrier Diode

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The determination of the interface-state density distribution from the capacitance-frequency measurements in Au/n-Si schottky barrier diodes

Journal of Electronic Materials ◽

10.1007/s11664-002-0157-9 ◽

2002 ◽

Vol 31 (2) ◽

pp. 119-123 ◽

Cited By ~ 45

Author(s):

E. Ayyildiz ◽

Ç. Nuho Lu ◽

A Türüt

Keyword(s):

Density Distribution ◽

Schottky Barrier ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Schottky Barrier Diodes ◽

Frequency Measurements

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Determination of Interface State Density Distribution and Surface Recombination Velocity on Passivated Semiconductor Surfaces by Photoluminescence Surface State Spectroscopy

Materials Science Forum ◽

10.4028/www.scientific.net/msf.185-188.53 ◽

1995 ◽

Vol 185-188 ◽

pp. 53-58

Author(s):

T. Saitoh ◽

Hisashi Hasegawa

Keyword(s):

Density Distribution ◽

Surface State ◽

Surface Recombination ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Surface Recombination Velocity ◽

Semiconductor Surfaces ◽

Recombination Velocity

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Electrical and interface state density properties of polyaniline–poly-3-methyl thiophene blend/p-Si Schottky barrier diode

Solid State Sciences ◽

10.1016/j.solidstatesciences.2010.02.001 ◽

2010 ◽

Vol 12 (5) ◽

pp. 706-711 ◽

Cited By ~ 42

Author(s):

Savaş Sönmezoğlu ◽

Sevilay Şenkul ◽

Recep Taş ◽

Güven Çankaya ◽

Muzaffer Can

Keyword(s):

Schottky Barrier ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Schottky Barrier Diode

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A facile growth of spray based ZnO films and device performance investigation for Schottky diodes: Determination of interface state density distribution

Journal of Alloys and Compounds ◽

10.1016/j.jallcom.2017.02.198 ◽

2017 ◽

Vol 708 ◽

pp. 55-66 ◽

Cited By ~ 27

Author(s):

Şakir Aydoğan ◽

Maria Luisa Grilli ◽

Mehmet Yilmaz ◽

Zakir Çaldiran ◽

Hatice Kaçuş

Keyword(s):

Density Distribution ◽

Schottky Diodes ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Zno Films ◽

Device Performance

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Interface state density analyzing of Au/TiO2(rutile)/n-Si Schottky barrier diode

Surface and Interface Analysis ◽

10.1002/sia.3331 ◽

2010 ◽

Vol 42 (6-7) ◽

pp. 1257-1260 ◽

Cited By ~ 12

Author(s):

H. Altuntas ◽

A. Bengi ◽

T. Asar ◽

U. Aydemir ◽

B. Sarıkavak ◽

...

Keyword(s):

Schottky Barrier ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Schottky Barrier Diode ◽

Tio2 Rutile

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Determination of the deep donor-like interface state density distribution in metal/Al2O3/n-GaN structures from the photocapacitance–light intensity measurement

Applied Physics Letters ◽

10.1063/1.4769815 ◽

2012 ◽

Vol 101 (23) ◽

pp. 231608 ◽

Cited By ~ 18

Author(s):

M. Matys ◽

B. Adamowicz ◽

T. Hashizume

Keyword(s):

Light Intensity ◽

Density Distribution ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Intensity Measurement ◽

Deep Donor

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Sources of errors in quasistatic capacitance-voltage determination of the interface state density distribution in the MOS system

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/10/1/010 ◽

1977 ◽

Vol 10 (1) ◽

pp. 83-95 ◽

Cited By ~ 6

Author(s):

Y T Yeow ◽

M R Boudry ◽

D R Lamb ◽

S D Brotherton

Keyword(s):

Density Distribution ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Capacitance Voltage

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Influence of Lateral Charge Inhomogeneities in MOS Structures on the Determination of the Interface State Density Distribution from HF CV Curves

phys stat sol (a) ◽

10.1002/pssa.2210790212 ◽

1983 ◽

Vol 79 (2) ◽

pp. 417-421 ◽

Cited By ~ 4

Author(s):

F. Fenske

Keyword(s):

Density Distribution ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Mos Structures

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A simple model for extraction of interface state density of a Schottky barrier diode using reverse bias C-V plots

International Journal of Electronics ◽

10.1080/002072100132291 ◽

2000 ◽

Vol 87 (2) ◽

pp. 153-161

Author(s):

Santosh Pandey ◽

S. Kal

Keyword(s):

Simple Model ◽

Schottky Barrier ◽

Reverse Bias ◽

Interface State ◽

State Density ◽

Interface State Density ◽

Schottky Barrier Diode

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