High precision deflection measurement of microcantilever in an optical pickup head based atomic force microscopy

2012 ◽  
Vol 83 (11) ◽  
pp. 113703 ◽  
Author(s):  
Sang Heon Lee
Keyword(s):  
Atomic Force Microscopy ◽  
High Precision ◽  
Optical Pickup ◽  
Force Microscopy ◽  
Deflection Measurement ◽  
Atomic Force ◽  
Optical Pickup Head

High-Precision Single-Molecule Characterization of the Folding of an HIV RNA Hairpin by Atomic Force Microscopy

Nano Letters ◽  
2018 ◽  
Vol 18 (10) ◽  
pp. 6318-6325 ◽  
Author(s):  
Robert Walder ◽  
William J. Van Patten ◽  
Dustin B. Ritchie ◽  
Rebecca K. Montange ◽  
Ty W. Miller ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Precision ◽  
Single Molecule ◽  
Force Microscopy ◽  
Hiv Rna ◽  
Atomic Force ◽  
Rna Hairpin

High resolution noncontact atomic force microscopy imaging with oxygen-terminated copper tips at 78 K

Nanoscale ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 2961-2965 ◽  
Author(s):  
Damla Yesilpinar ◽  
Bertram Schulze Lammers ◽  
Alexander Timmer ◽  
Saeed Amirjalayer ◽  
Harald Fuchs ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
High Precision ◽  
Organic Molecule ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Bond Lengths ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging

AFM experiments at 78 K with an atomically defined O-terminated Cu tip allow determining bond lengths of an organic molecule with high precision.

Acquisition of high-precision images for non-contact atomic force microscopy

Mechatronics ◽  
2006 ◽  
Vol 16 (10) ◽  
pp. 655-664 ◽  
Author(s):  
Hossein Nejat Pishkenari ◽  
Nader Jalili ◽  
Ali Meghdari
Keyword(s):  
Atomic Force Microscopy ◽  
High Precision ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals High-precision atomic force microscopy with atomically-characterized tips

2020 ◽  
Vol 22 (6) ◽  
pp. 063040 ◽  
Author(s):  
A Liebig ◽  
A Peronio ◽  
D Meuer ◽  
A J Weymouth ◽  
F J Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
High Precision ◽  
Force Microscopy ◽  
Atomic Force

Probe Rotating Atomic Force Microscopy for material characterization

2014 ◽  
Vol 1712 ◽  
Author(s):  
Sang Heon Lee
Keyword(s):  
Atomic Force Microscopy ◽  
Material Characterization ◽  
Standard Sample ◽  
Cartesian Coordinate System ◽  
Arbitrary Direction ◽  
Optical Pickup ◽  
Force Microscopy ◽  
Atomic Force ◽  
Cartesian Coordinate ◽  
Different Characteristics

ABSTRACTAs the conventional atomic force microscopy (AFM) uses a Cartesian coordinate system to scan sample and the probe has different characteristics in each direction, it is impossible to scan in arbitrary direction. Therefore, we present the AFM which is able to rotate its probe. The deflection of cantilever was measured using optical pickup head of DVD drive. For verifying the system feasibility, the multidirectional scanning of the standard sample was carried out. Also we presented the modified structure which includes aligner and mirror to enhance the performance.

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